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AMC7823 Datasheet, PDF (6/48 Pages) Texas Instruments – ANALOG MONITORING AND CONTROL CIRCUIT
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AMC7823
SLAS453A – APRIL 2005 – REVISED OCTOBER 2005
www.ti.com
ELECTRICAL CHARACTERISTICS: +3 V
At –40°C to +85°C, AVDD, DVDD, BVDD = 3 V, using external 1.25-V reference (unless otherwise noted).
AMC7823
PARAMETER
CONDITIONS
MIN TYP
MAX UNITS
ADC ANALOG INPUTS
Input voltage range
Input impedance
0
2 × VREF
V
5
MΩ
Input capacitance
15
pF
Input leakage current
±1
µA
ANALOG-TO-DIGITAL CONVERTER
Resolution
12 Bits
No missing codes
12
Bits
Integral linearity
±1 LSB(1)
Differential linearity
±1 LSB
Offset error
±3 LSB
Offset error drift
±4
ppmFS/°C
Offset error match
0.5
1 LSB
Gain error
±12 LSB
Gain error match
0.3
1.5 LSB
Noise
Power-supply rejection
Throughput rate
AVDD = 3 V ±5%
70
µVRMS
70
dB
200
kHz
Total conversion time
Scan Channels 0 through 7
47
µs
Total conversion time including temperature
Scan Channels 0 through 8
58
µs
Channel-to-channel isolation
DIGITAL-TO-ANALOG CONVERTER(2)
VIN = 2.5 VPP at 10 kHz
0.5
LSB
Output voltage range
Output current
Programmable
Refer to Typical Characteristics
0
2 × VREF
V
±1
mA
Resolution
12 Bits
Integral linearity(3)
±2
±8 LSB
Monotonicity
12
Bits
Differential linearity
±0.2
±1 LSB
Offset error
Offset error drift
Output range = 0 to VREF
Output range = 0 to 2 x VREF
±0.5
±5 mV
±1
±10 mV
±4
ppmFS/°C
Gain error
Settling time
Output range = 0 to 2 x VREF
Step between code 0x400 to 0xC00,
to ±1 LSB
±0.2
±1.0 %FS
2
µs
Code change glitch
1 LSB change, in worst case
20
nV-s
Overshoot
Step between code 0x400 to 0xC00
200
mV
Crosstalk
Step between code 0x400 to 0xC00
<0.5
LSB
Signal-to-noise ratio
Output noise voltage density
Sine wave (1 kHz, 5 VPP) generated by
DAC, sampling at 400 kSPS,
RL = 10 kΩ, CL = 100 pF
Output buffer gain = 2
Output buffer gain = 1
74
dB
60
nV/√Hz
30
nV/√Hz
(1) LSB means least significant bit.
(2) DAC is tested with load of 25 kΩ in parallel with 100 pF to ground.
(3) Measured from code 0x008 to 0xFFF.
6
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