TLC320AD56C Datasheet, PDF (31/43 Pages) Texas Instruments – Sigma-Delta Analog Interface Circuit

4.3.7 DAC Dynamic Performance, DV_DD = 5 V or 3 V
4.3.7.1 DAC Signal-to-Noise (see Note 7)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VO = 0 dB
80
85
Signal-to-noise ratio (SNR)
VO = – 9 dB
72
77
dB
VO = – 40 dB
41
46
VO = – 65 dB
16
21
NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test
is measured at the output of a single pole RC filter with a cutoff frequency of 32 kHz. The test is conducted in
16-bit mode.
4.3.7.2 DAC Signal-to- Distortion (see Note 7)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VO = 0 dB
86
92
Signal-to-total harmonic distortion (THD)
VO = – 9 dB
90
96
dB
VO = – 40 dB
60
66
VO = – 65 dB
40
46
NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test
is measured at the output of a single pole RC filter with a cutoff frequency of 32 kHz. The test is conducted in
16-bit mode.
4.3.7.3 DAC Signal-to- Distortion+Noise (see Note 7)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VO = 0 dB
80
84
Total harmonic distortion + noise (THD+N)
VO = – 9 dB
72
76
dB
VO = – 40 dB
41
45
VO = – 65 dB
16
20
NOTE 7: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test
is measured at the output of a single pole RC filter with a cutoff frequency of 32 kHz. The test is conducted in
16-bit mode.
4–5