TLC320AD56C Datasheet, PDF (30/43 Pages) Texas Instruments – Sigma-Delta Analog Interface Circuit

4.3.4.5 ADC Signal-to-Distortion+Noise, DV_DD = 3 V (see Note 5)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VI = – 1 dB
78
VI = – 3 dB
79
84
VI = – 6 dB
76
81
Total harmonic distortion + noise (THD+N)
VI = – 9 dB
73
78
dB
VI = – 40 dB
42
47
VI = – 65 dB
17
22
VAUX = – 9 dB
73
78
NOTE 5: The test condition is a 1020-Hz input signal with an 8-kHz conversion rate. Input and output voltages are
referred to VDD /2.
4.3.5 ADC Channel
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
VI(PP)
Peak-to-peak input voltage
Dynamic range
6
V
87
Interchannel isolation
110
dB
EG
Gain error
VI = – 1 dB at 1020 Hz
± 0.3
EO(ADC) ADC converter offset error
5
mV
CMRR
Common-mode rejection ratio at INM,
INP or AUXM, AUXP
VI = 0 dB at 1020 kHz
80
dB
Idle channel noise (on-chip reference)
30
75 µV rms
Ri
Input resistance
Channel delay
TA = 25°C
100
kΩ
17/fs
s
4.3.6 DAC Path Filter, MCLK = 8.192 MHz, f_s = 8 kHz (see Note 6)
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
0 to 300 Hz
– 0.5
0.2
300 Hz to 3 kHz – 0.25
0.25
Filter gain relative to gain at 1020 Hz
3.3 kHz
3.6 kHz
– 0.35
0.3
dB
–3
4 kHz
– 40
≥ 4.4 kHz
– 74
NOTE 6: The filter gain outside of the passband is measured with respect to the gain at 1020 Hz. The input signal is the
digital equivalent of a sine wave (digital full scale = 0 dB). The nominal differential DAC channel output with
this input condition is 6 VI(PP). The –1 dB pass band is 0 to 3400 Hz for an 8-kHz sample rate. This pass band
scales linearly with the sample rate.
4–4