DAC8565 Datasheet, PDF (23/46 Pages) Texas Instruments – 16-Bit, Quad Channel, Ultra-Low Glitch, Voltage Output DIGITAL-TO-ANALOG CONVERTER with 2.5V, 2ppm/°C Internal Reference

DAC8565
www.ti.com
SBAS411A – JUNE 2007 – REVISED NOVEMBER 2007
TYPICAL CHARACTERISTICS: DAC at V_DD = 2.7V (continued)
At T_A = +25°C, internal reference used, and DAC output not loaded, all DAC codes in straight binary data format, unless
otherwise noted
GLITCH ENERGY:
2.7V, 1LSB STEP, RISING EDGE
GLITCH ENERGY:
2.7V, 1LSB STEP, FALLING EDGE
V_DD = 2.7V
Int V_REF = 2.5V
From Code: 7FFFh
To Code: 8000h
Glitch: 0.08nV-s
Time (400ns/div)
Figure 84.
GLITCH ENERGY:
2.7V, 16LSB STEP, RISING EDGE
V_DD = 2.7V
Int V_REF = 2.5V
From Code: 8000h
To Code: 8010h
Glitch: 0.04nV-s
Time (400ns/div)
Figure 86.
GLITCH ENERGY:
2.7V, 256LSB STEP, RISING EDGE
V_DD = 2.7V
Int V_REF = 2.5V
From Code: 8000h
To Code: 80FFh
Glitch: Not Detected
Theoretical Worst Case
Time (400ns/div)
Figure 88.
V_DD = 2.7V
Int V_REF = 2.5V
From Code: 8000h
To Code: 7FFFh
Glitch: 0.16nV-s
Measured Worst Case
Time (400ns/div)
Figure 85.
GLITCH ENERGY:
2.7V, 16LSB STEP, FALLING EDGE
V_DD = 2.7V
Int V_REF = 2.5V
From Code: 8010h
To Code: 8000h
Glitch: 0.12nV-s
Time (400ns/div)
Figure 87.
GLITCH ENERGY:
2.7V, 256LSB STEP, FALLING EDGE
V_DD = 2.7V
Int V_REF = 2.5V
From Code: 80FFh
To Code: 8000h
Glitch: Not Detected
Theoretical Worst Case
Time (400ns/div)
Figure 89.
Copyright © 2007, Texas Instruments Incorporated
Product Folder Link(s): DAC8565
Submit Documentation Feedback
23