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DAC8565 Datasheet, PDF (2/46 Pages) Texas Instruments – 16-Bit, Quad Channel, Ultra-Low Glitch, Voltage Output DIGITAL-TO-ANALOG CONVERTER with 2.5V, 2ppm/°C Internal Reference
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DAC8565
SBAS411A – JUNE 2007 – REVISED NOVEMBER 2007
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION(1)
PRODUCT
DAC8565A
DAC8565B
DAC8565C
DAC8565D
RELATIVE
ACCURACY
(LSB)
±12
±8
±12
±8
DIFFERENTIAL
NONLINEARITY
(LSB)
±1
±1
±1
±1
REFERENCE
DRIFT
(ppm/°C)
25
25
5
5
PACKAGE-
LEAD
TSSOP-16
TSSOP-16
TSSOP-16
TSSOP-16
PACKAGE
DESIGNATOR
PW
PW
PW
PW
SPECIFIED
TEMPERATURE
RANGE
–40°C to +105°C
–40°C to +105°C
–40°C to +105°C
–40°C to +105°C
PACKAGE
MARKING
D8565
D8565B
D8565
D8565D
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range (unless otherwise noted).
AVDD to GND
Digital input voltage to GND
VOUT to GND
VREF to GND
Operating temperature range
Storage temperature range
Junction temperature range (TJ max)
Power dissipation
Thermal impedance, θJA
Thermal impedance, θJC
ESD rating
Human body model (HBM)
Charged device model (CDM)
DAC8565
–0.3 to +6
–0.3 to +VDD + 0.3
–0.3 to +VDD + 0.3
–0.3 to +VDD + 0.3
–40 to +125
–65 to +150
+150
(TJ max – TA)/θJA
+118
+29
4000
1500
UNIT
V
V
V
V
°C
°C
°C
W
°C/W
°C/W
V
V
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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