5962-9958101QXC Datasheet, PDF (15/17 Pages) Texas Instruments – MICROCIRCUIT DATA SHEET

MNAR629A-X REV 0A0
MICROCIRCUIT DATA SHEET
(Continued)
Note 1: Tested during initial qual only and after process/design changes; tested at 25 C
only.
Note 2: TTL input only.
Note 3: All output leakage current is measured at tri-state.
Note 4: Same as NSC symbol TDAE.
Note 5: Same as NSC symbol TDBUSQRIVS.
Note 6: Same as NSC symbol TDRIVSRIVS.
Note 7: Same as NSC symbol TDES.
Note 8: Same as NSC symbol TDSE.
Note 9: Same as NSC symbol TWTXO.
Note 10: These parameters are measured at 2.0V on the rising and falling edges of a high pulse
and extrapolated to 0.8V on the rising and falling edges of a low pulse.
Note 11: Same as NSC symbol TWTXOH and TWTXOL.
Note 12: TWH is measured from 0.75Vdd on the clock rising edge and 0.75Vdd -1.0V on the clock
falling edge. TWL is measured from 1V on the clock falling edge and 2V on the clock
rising edge. The clock used to measure these parameters has a minimum slew rate of
1.0V/nS.
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