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TLC2543-EP Datasheet, PDF (1/25 Pages) Texas Instruments – 12-BIT ANALOG-TO-DIGITAL CONVERTER WITH SERIAL CONTROL AND 11 ANALOG INPUTS
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TLC2543-EP
12-BIT ANALOG-TO-DIGITAL CONVERTER
WITH SERIAL CONTROL AND 11 ANALOG INPUTS
SGLS125A – JULY 2002 – REVISED NOVEMBER 2006
FEATURES
• Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
• Extended Temperature Performance of –40°C
to 125°C (TLC2543Q) and –55°C to 125°C
(TLC2543M)
• Enhanced Diminishing Manufacturing Sources
(DMS) Support
• Enhanced Product Change Notification
• Qualification Pedigree (1)
• 12-Bit-Resolution Analog-to-Digital Converter
(ADC)
• 10-µs Conversion Time Over Operating
Temperature
• 11 Analog Input Channels
• Three Built-In Self-Test Modes
• Inherent Sample-and-Hold Function
• Linearity Error . . . ±1 LSB Max
• On-Chip System Clock
• End-of-Conversion (EOC) Output
• Unipolar or Bipolar Output Operation (Signed
Binary With Respect to 1/2 the Applied
Voltage Reference)
• Programmable Most Significant Bit (MSB) or
Least Significant Bit (LSB) First
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
• Programmable Power Down
• Programmable Output Data Length
• CMOS Technology
• Application Report Available (2)
DW PACKAGE
(TOP VIEW)
AIN0 1
AIN1 2
AIN2 3
AIN3 4
AIN4 5
AIN5 6
AIN6 7
AIN7 8
AIN8 9
GND 10
20 VCC
19 EOC
18 I/O CLOCK
17 DATA INPUT
16 DATA OUT
15 CS
14 REF +
13 REF −
12 AIN10
11 AIN9
(2) Microcontroller Based Data Acquisition Using the TLC2543
12-bit Serial-Out ADC (SLAA012)
DESCRIPTION/ORDERING INFORMATION
The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This
device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA
INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial
3-state output. The device allows high-speed data transfers from the host.
In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel
multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold
function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that
conversion is complete. The converter incorporated in the device features differential high-impedance reference
inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise.
A switched-capacitor design allows low-error conversion over the full operating temperature range.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2006, Texas Instruments Incorporated