STB80N4F6AG Datasheet, PDF (8/15 Pages) STMicroelectronics – High avalanche ruggedness

Test circuits
3
Test circuits
Figure 13: Test circuit for resistive load
switching times
STB80N4F6AG
Figure 14: Test circuit for gate charge
behavior
Figure 15: Test circuit for inductive load
switching and diode recovery times
Figure 16: Unclamped inductive load test
circuit
Figure 17: Unclamped inductive waveform
Figure 18: Switching time waveform
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