SI554 Datasheet, PDF (7/15 Pages) Silicon Laboratories – QUAD FREQUENCY VOLTAGE-CONTROLLED CRYSTAL

Si554
Table 7. CLK± Output Phase Noise (Typical)
Offset Frequency
100 Hz
1 kHz
10 kHz
100 kHz
1 MHz
10 MHz
100 MHz
74.25 MHz
90 ppm/V
LVPECL
–87
–114
–132
–142
–148
–150
n/a
491.52 MHz
45 ppm/V
LVPECL
–75
–100
–116
–124
–135
–146
–147
622.08 MHz
135 ppm/V
LVPECL
–65
–90
–109
–121
–134
–146
–147
Units
dBc/Hz
Table 8. Environmental Compliance
The Si554 meets the following qualification test requirements.
Mechanical Shock
Parameter
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solvents
Moisture Sensitivity Level
Contact Pads
Conditions/Test Method
MIL-STD-883F, Method 2002.3 B
MIL-STD-883F, Method 2007.3 A
MIL-STD-883F, Method 203.8
MIL-STD-883F, Method 1014.7
MIL-STD-883F, Method 2016
J-STD-020, MSL 1
J-STD-020, MSL 1
Table 9. Thermal Characteristics
(Typical values TA = 25 ºC, V_DD = 3.3 V)
Parameter
Symbol Test Condition Min
Typ
Max Unit
Thermal Resistance Junction to Ambient
_JA
Thermal Resistance Junction to Case
_JC
Ambient Temperature
T_A
Junction Temperature
T_J
Still Air
Still Air
—
84.6
— °C/W
—
38.8
— °C/W
–40
—
85
°C
—
—
125
°C
Rev. 1.1
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