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SI554 Datasheet, PDF (2/15 Pages) Silicon Laboratories – QUAD FREQUENCY VOLTAGE-CONTROLLED CRYSTAL | |||
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Si554
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter
Symbol Test Condition
Min
Typ
Max Units
Supply Voltage1
3.3 V option
VDD
2.5 V option
1.8 V option
2.97
3.3
3.63
V
2.25
2.5
2.75
V
1.71
1.8
1.89
V
Supply Current
Output enabled
LVPECL
â
120
130
CML
IDD
LVDS
â
108
117
mA
â
99
108
CMOS
â
90
98
Tristate mode
â
60
75
mA
Output Enable (OE)
and Frequency Select FS[1:0]2
VIH
0.75 x VDD
â
â
V
VIL
â
â
0.5
V
Operating Temperature Range
TA
â40
â
85
ºC
Notes:
1. Selectable parameter specified by part number. See Section 3. "Ordering Information" on page 10 for further details.
2. OE and FS[1:0] pins include a 17 kï resistor to VDD.
Table 2. VC Control Voltage Input
Parameter
Symbol Test Condition
Min
Typ
Max Units
Control Voltage Tuning Slope1,2,3
10 to 90% of VDD
â
33
â
ppm/V
45
90
KV
135
180
356
Control Voltage Linearity4
BSL
â5
±1
+5
%
LVC
Incremental
â10
±5
+10
%
Modulation Bandwidth
BW
9.3
10.0
10.7
kHz
VC Input Impedance
ZVC
500
â
â
kï
Nominal Control Voltage
VCNOM
@ fO
â
VDD/2
â
V
Control Voltage Tuning Range
VC
0
VDD
V
Notes:
1. Positive slope; selectable option by part number. See Section 3. "Ordering Information" on page 10.
2. For best jitter and phase noise performance, always choose the smallest KV that meets the applicationâs minimum APR
requirements. See âAN266: VCXO Tuning Slope (KV), Stability, and Absolute Pull Range (APR)â for more information.
3. KV variation is ±10% of typical values.
4. BSL determined from deviation from best straight line fit with VC ranging from 10 to 90% of VDD. Incremental slope
determined with VC ranging from 10 to 90% of VDD.
2
Rev. 1.1
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