SI570 Datasheet, PDF (6/26 Pages) Silicon Laboratories – ANY-RATE I2C PROGRAMMABLE XO/VCXO

Si570/Si571
Table 3. CLK± Output Frequency Characteristics
Parameter
Symbol
Test Condition
Min Typ Max Units
Programmable Frequency
LVPECL/LVDS/CML
10
—
945
Range^1,2,3
f_O
MHz
CMOS
10
—
160
Temperature Stability^1,4
T_A = –40 to +85 ºC
–20
—
+20
–50
—
+50 ppm
–100 — +100
Aging
Frequency drift over first year
—
f_a
Frequency drift over 15 year life —
—
±3
ppm
—
±10 ppm
Total Stability
Temp stability = ±20 ppm
Temp stability = ±50 ppm
—
— ±31.5 ppm
—
— ±61.5 ppm
Absolute Pull Range^1,4
APR
±25
— ±375 ppm
Power up Time⁵
t_OSC
—
—
10
ms
Settling Time after Frequency
Change
t_FRQ
f₁ within ±100 ppm of f₀
f₁ > ±100 ppm of f₀
—
—
100
µs
—
—
10
ms
Notes:
1. See Section "7. Ordering Information" on page 21 for further details.
2. Specified at time of order by part number. Also available in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.
3. Nominal output frequency set by V_CNOM = 1/2 x V_DD.
4. Selectable parameter specified by part number.
5. Time from power up or tristate mode to f_O.
6
Rev. 0.3