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SI570 Datasheet, PDF (11/26 Pages) Silicon Laboratories – ANY-RATE I2C PROGRAMMABLE XO/VCXO | |||
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Si570/Si571
Table 11. Environmental Compliance
The Si570/571 meets the following qualification test requirements.
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solvents
Conditions/Test Method
MIL-STD-883F, Method 2002.3 B
MIL-STD-883F, Method 2007.3 A
MIL-STD-883F, Method 203.8
MIL-STD-883F, Method 1014.7
MIL-STD-883F, Method 2016
Table 12. Programming Constraints
(VDD = 3.3 V ±10%, TA = â40 to 85 ºC)
Parameter
Symbol
Output Frequency
CKOF
M and RFREQ Value LSB
Resolution
Internal Oscillator Frequency
Unfreeze to NewFreq Delay
MRES
fOSC
Test Condition
Min
Typ
Max
HS_DIV x N1 > = 6
10
â
945
HS_DIV x N1 = 5
970
â
1134
N1 = 1
HS_DIV = 4
N1 = 1
1.2125 â 1.4175
114.285 MHz
â
0.09
â
3rd Overtone Crystal
4850
â
5670
â
â
10
Unit
MHz
MHz
GHz
ppb
MHz
ms
Rev. 0.3
11
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