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SI86XX Datasheet, PDF (28/52 Pages) Silicon Laboratories – No start-up initialization required
Si86xx
Table 11. Absolute Maximum Ratings1
Parameter
Storage Temperature2
Ambient Temperature Under Bias
Junction Temperature
Supply Voltage
Input Voltage
Output Voltage
Output Current Drive Channel
(All devices unless otherwise stated)
Output Current Drive Channel
(All Si86xxxA-x-xx devices)
Latchup Immunity3
Symbol
TSTG
TA
TJ
VDD1, VDD2
VI
VO
IO
IO
Min
–65
–40
—
–0.5
–0.5
–0.5
—
—
—
Max
Unit
150
ºC
125
ºC
150
°C
7.0
V
VDD + 0.5
V
VDD + 0.5
V
10
mA
22
mA
100
V/ns
Lead Solder Temperature (10 s)
—
260
ºC
Maximum Isolation (Input to Output) (1 sec)
NB SOIC-16, SOIC-8
Maximum Isolation (Input to Output) (1 sec)
WB SOIC-16
—
4500
VRMS
—
6500
VRMS
Notes:
1. Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be
restricted to conditions as specified in the operational sections of this data sheet.
2. VDE certifies storage temperature from –40 to 150 °C.
3. Latchup immunity specification is for slew rate applied across GND1 and GND2.
28
Rev. 1.0