SI53112-A03A Datasheet, PDF (16/34 Pages) Silicon Laboratories – DB1200ZL 12-OUTPUT PCIE GEN 3 BUFFER

Si53112-A03A
3. Test and Measurement Setup
3.1. Input Edge
Input edge rate is based on single-ended measurement. This is the minimum input edge rate at which the Si53112-
A03A is guaranteed to meet all performance specifications.
Table 15. Input Edge Rate
Frequency
Min
100 MHz
0.35
133 MHz
0.35
Max
N/A
N/A
Unit
V/ns
V/ns
3.1.1. Measurement Points for Differential
+150 mV
Slew_rise
Slew_fall
+150 mV
0.0 V V_swing 0.0 V
-150 mV
Diff
Vovs
VHigh
Vrb
Figure 4. Measurement Points for Rise Time and Fall Time
-150 mV
Vrb
VLow
Vuds
Figure 5. Single-Ended Measurement Points for V_ovs, V_uds, V_rb
16
Rev. 1.0