SI5310 Datasheet, PDF (10/26 Pages) Silicon Laboratories – PRECISION CLOCK MULTIPLIER/REGENERATOR IC

Si5310
Table 5. Minimum Jitter Tolerance in Nanoseconds* (MULTSEL = 0, MULTOUT = 600 to 668 MHz)
Frequency (Hz)
37.5–41.75 MHz
Clock Input
75–83.5 MHz
Clock Input
< 300
25.0
25.0
25K
1.6
3.2
250K
1.6
3.2
> 1M
0.3
0.3
*Note: Measured using sinusoidal jitter at stated Test Condition frequency.
150–167 MHz
Clock Input
25.0
6.5
3.0
0.5
300–334 MHz
Clock Input
25.0
16
3.2
0.5
Table 6. Minimum Jitter Tolerance in Nanoseconds* (MULTSEL = 1, MULTOUT = 150 to 167 MHz)
Frequency (Hz)
9.375–10.438 MHz 18.75–20.875 MHz
Clock Input
Clock Input
< 300
66.7
66.7
6.5K
6.4
13.0
65K
1.2
1.9
325K
1.2
1.9
> 1M
1.2
1.9
*Note: Measured using sinusoidal jitter at stated Test Condition frequency.
37.5–41.75 MHz
Clock Input
66.7
29.0
1.9
1.9
1.9
75–83.5 MHz
Clock Input
66.7
33.3
4.8
2.6
1.9
Table 7. Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
DC Supply Voltage
LVTTL Input Voltage
Differential Input Voltages
Maximum Current any output PIN
V_DD
–0.5 to 2.8
V
V_DIG
–0.3 to 3.6
V
V_DIF
–0.3 to (V_DD+ 0.3)
V
±50
mA
Operating Junction Temperature
T_JCT
–55 to 150
°C
Storage Temperature Range
T_STG
–55 to 150
°C
ESD HBM Tolerance (100 pf, 1.5 kΩ)
CLKIN+, CLKIN–, REFCLK+, REFCLK–,
—
1
kV
All other pins
—
1.5
kV
Note: Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation
should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Table 8. Thermal Characteristics
Parameter
Thermal Resistance Junction to Ambient
Symbol
ϕ_JA
Test Condition
Still Air
Value
38
Unit
°C/W
10
Rev. 1.2