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S-8243A Datasheet, PDF (9/34 Pages) Seiko Instruments Inc – BATTRY PROTECTION IC FOR 3-SERIAL OR 4-SERIAL CELL PACK
Rev.2.4_00
BATTERY PROTECTION IC FOR 3-SERIAL OR 4-SERIAL CELL PACK
S-8243A/B Series
Table 6 (2/2)
Item
Symbol
Remarks
INPUT CURRENT
Current consumption at not
monitoring VBATOUT
Current consumption at power
down
IOPE V1=V2=V3=3.5 V, VMP=VDD
IPDN V1=V2=V3=1.5 V, VMP=VSS
Current for VCN at not
monitoring VBATOUT (n=2, 3)
Current for VC2 at monitoring of
VBATOUT
Current for VC3 at monitoring of
VBATOUT
Current for CTL1 at Low
Current for CTLn at High
n=2,3,4
IVCnN
IVC2
IVC3
ICTL1L
ICTLnH
V1=V2=V3=3.5 V
V1=V2=V3=3.5 V
V1=V2=V3=3.5 V
V1=V2=V3=3.5 V, VCTL1=0 V
VCTLn=VOUT
Current for CTLn at Low
n=2,3,4
ICTLnL
VCTLn=0 V
OUTPUT CURRENT
Leak current COP
Sink current COP
Source current DOP
Sink current DOP
Source current VBATOUT
Sink current VBATOUT
ICOH
ICOL
IDOH
IDOL
IVBATH
IVBATL
VCOP=24 V
VCOP=VSS+0.5 V
VDOP=VDD−0.5 V
VDOP=VSS+0.5 V
− VBATOUT=VDD 0.5 V
VBATOUT=VSS+0.5 V
Min.
⎯
⎯
−0.3
⎯
⎯
−0.4
⎯
−5
⎯
10
10
10
100
100
Typ.
65
⎯
0
2.0
1.0
−0.2
2.5
−2.5
⎯
⎯
⎯
⎯
⎯
⎯
Max.
Unit Test circuit
120
μA
1
0.1
μA
1
0.3
μA
3
7.2
μA
3
4.0
μA
3
⎯
μA
5
5
μA
9
⎯
μA
9
0.1
μA
9
⎯
μA
9
⎯
μA
9
⎯
μA
9
⎯
μA
9
⎯
μA
9
Applied to S-8243AACFT and S-8243AADFT
Item
Symbol
Conditions
Min.
Typ.
Max.
Unit Test circuit
DELAY TIME
Overcharge detection delay time tCU
Overdischarge detection delay
time
tDL
CCT=0.1 μF
CDT=0.1 μF
0.5
1.0
50
100
1.5
s
5
150
ms
5
Overcurrent detection delay time 1 tlOV1
CDT=0.1 μF
5
10
15
ms
5
Overcurrent detection delay time 2 tlOV2
⎯
1.5
2.5
4.0
ms
4
Overcurrent detection delay time 3 tlOV3
⎯
100
300
600
μs
4
*1. Temperature coefficient for detection and release voltage is applied to overcharge detection voltage n, overcharge release voltage n,
overdischarge detection voltage n, and overdischarge release voltage n.
*2. Temperature coefficient for overcurrent detection voltage is applied to over current detection voltage 1 and 2.
Seiko Instruments Inc.
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