S-8241ABKMC-GBKT2G Datasheet, PDF (14/39 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 1-CELL PACK

BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
Rev.9.1_00
(5) S-8241ADF, S-8241ADG, S-8241ADI, S-8241ADJ, S-8241ADK, S-8241AEV
Table 14
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40°C to +85°C) ^*1
t_CU
t_DL
t_lOV1
t_lOV2
t_SHORT
⎯
0.175 0.25 0.325 ms
8
1
⎯
21 31 41 ms
8
1
⎯
11 16 21 ms
9
1
⎯
1.4
2
2.6 ms
9
1
⎯
⎯ 10 50 μs
9
1
Overcharge detection delay time
t_CU
⎯
0.138 0.25 0.425 s
8
1
Overdischarge detection delay time
t_DL
⎯
17 31 53 ms
8
1
Overcurrent 1 detection delay time
t_IOV1
⎯
9
16 27 ms
9
1
Overcurrent 2 detection delay time
t_IOV2
⎯
1.1
2
3.4 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
(6) S-8241AEE
Table 15
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
0.7 1.0 1.3
s
8
1
Overdischarge detection delay time
t_DL
⎯
87.5 125 162.5 ms
8
1
Overcurrent 1 detection delay time
t_lOV1
⎯
11 16 21 ms
9
1
Overcurrent 2 detection delay time
t_lOV2
⎯
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 50 μs
9
1
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
t_CU
t_DL
t_IOV1
t_IOV2
t_SHORT
⎯
0.55 1.0 1.7
s
8
1
⎯
69 125 212 ms
8
1
⎯
9
16 27 ms
9
1
⎯
1.1
2
3.4 ms
9
1
⎯
⎯ 10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
14
Seiko Instruments Inc.