S-8241ABKMC-GBKT2G Datasheet, PDF (13/39 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 1-CELL PACK

Rev.9.1_00
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
(3) S-8241ABW, S-8241ABY
Table 12
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
0.175 0.25 0.325 s
8
1
Overdischarge detection delay time
t_DL
⎯
87.5 125 162.5 ms
8
1
Overcurrent 1 detection delay time
t_lOV1
⎯
5.6
8 10.4 ms
9
1
Overcurrent 2 detection delay time
t_lOV2
⎯
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 50 μs
9
1
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
t_CU
t_DL
t_IOV1
t_IOV2
t_SHORT
⎯
0.138 0.25 0.425 s
8
1
⎯
69 125 212 ms
8
1
⎯
4.4
8
14 ms
9
1
⎯
1.1
2
3.4 ms
9
1
⎯
⎯ 10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
(4) S-8241ABR, S-8241ACD
Table 13
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
1.4 2.0 2.6
s
8
1
Overdischarge detection delay time
t_DL
⎯
87.5 125 162.5 ms
8
1
Overcurrent 1 detection delay time
t_lOV1
⎯
5.6
8 10.4 ms
9
1
Overcurrent 2 detection delay time
t_lOV2
⎯
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 50 μs
9
1
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
t_CU
⎯
1.1 2.0 3.4
s
8
1
Overdischarge detection delay time
t_DL
⎯
69 125 212 ms
8
1
Overcurrent 1 detection delay time
t_IOV1
⎯
4.4
8
14 ms
9
1
Overcurrent 2 detection delay time
t_IOV2
⎯
1.1
2
3.4 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
Seiko Instruments Inc.
13