S-8241ABKMC-GBKT2G Datasheet, PDF (12/39 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 1-CELL PACK

BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
Rev.9.1_00
3. Detection delay time
(1) S-8241ABA, S-8241ABC, S-8241ABD, S-8241ABE, S-8241ABF, S-8241ABG, S-8241ABH,
S-8241ABI, S-8241ABK, S-8241ABL, S-8241ABQ, S-8241ABT, S-8241ABU, S-8241ABV,
S-8241ABX, S-8241ABZ, S-8241ACA, S-8241ACB, S-8241ACE, S-8241ACF, S-8241ACG,
S-8241ACH, S-8241ACL, S-8241ACO, S-8241ACP, S-8241ACQ, S-8241ACR, S-8241ACS,
S-8241ACT, S-8241ACU, S-8241ACX, S-8241ACY, S-8241ADA, S-8241ADD, S-8241ADH,
S-8241ADL, S-8241ADM, S-8241ADN, S-8241ADO, S-8241ADQ, S-8241ADR, S-8241ADS,
S-8241ADT, S-8241ADV, S-8241ADW, S-8241ADX, S-8241ADY, S-8241ADZ, S-8241AEA,
S-8241AEB, S-8241AEC, S-8241AED, S-8241AEF, S-8241AEI, S-8241AEJ, S-8241AEK,
S-8241AEM, S-8241AEO, S-8241AEP, S-8241AEQ, S-8241AET, S-8241AEW, S-8241AEX,
S-8241AEY
Table 10
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
0.7 1.0 1.3
s
8
1
Overdischarge detection delay time
t_DL
⎯
87.5 125 162.5 ms
8
1
Overcurrent 1 detection delay time
t_lOV1
⎯
5.6
8 10.4 ms
9
1
Overcurrent 2 detection delay time
t_lOV2
⎯
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 50 μs
9
1
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
t_CU
t_DL
t_IOV1
t_IOV2
t_SHORT
⎯
0.55 1.0 1.7
s
8
1
⎯
69 125 212 ms
8
1
⎯
4.4
8
14 ms
9
1
⎯
1.1
2
3.4 ms
9
1
⎯
⎯ 10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
(2) S-8241ABB, S-8241ABO, S-8241ABP, S-8241ABS, S-8241ACI, S-8241ACK, S-8241ACN,
S-8241ACZ, S-8241ADE, S-8241AEH, S-8241AEN, S-8241AER, S-8241AES, S-8241AEU
Table 11
Test Test
Item
Symbol
Condition
Min. Typ. Max. Unit _{Condition Circuit}
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
t_CU
⎯
87.5 125 162.5 ms
8
1
Overdischarge detection delay time
t_DL
⎯
21 31 41 ms
8
1
Overcurrent 1 detection delay time
t_lOV1
⎯
11 16 21 ms
9
1
Overcurrent 2 detection delay time
t_lOV2
⎯
1.4
2
2.6 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 50 μs
9
1
DELAY TIME (Ta = −40°C to +85°C) ^*1
Overcharge detection delay time
t_CU
⎯
69 125 212 ms
8
1
Overdischarge detection delay time
t_DL
⎯
17 31 53 ms
8
1
Overcurrent 1 detection delay time
t_IOV1
⎯
9
16 27 ms
9
1
Overcurrent 2 detection delay time
t_IOV2
⎯
1.1
2
3.4 ms
9
1
Load short-circuiting detection delay time t_SHORT
⎯
⎯ 10 73 μs
9
1
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
design, not tested in production.
12
Seiko Instruments Inc.