DS_S1M8837 Datasheet, PDF (23/29 Pages) Samsung semiconductor – FRACTIONAL-N RF/INTEGER-N IF DUAL PLL

FRACTIONAL-N RF/INTEGER-N IF DUAL PLL
S1M8836/37
foLD Control
Control Words
foLD
Control bits
W3[21:18]
Acronym
foLD
LOW (0)
HIGH (1)
select LDs monitoring mode of
internal counters.
Comments
Lock Detector
(LD), Test mode
foLD[3]
0
0
0
0
X
X
X
X
1
1
1
1
foLD[2]
0
0
0
0
1
1
1
1
0
0
0
0
foLD[1]
0
0
1
1
0
0
1
1
0
0
1
1
foLD[0]
0
1
0
1
0
1
0
1
0
1
0
1
foLD Output State
Disabled(default LOW)
RF and IF Analog Lock Detect
Reserved Test Mode
Reserved Test Mode
Reserved Test Mode
IF R Counter Output
IF N Counter Output
RF R Counter Output
RF N Counter Output
Reserved Test Mode
Reserved Test Mode
Reserved Test Mode
 When the PLL is locked and the analog lock detect mode is selected, the foLD output is HIGH, with narrow
pulses LOW.
Lock Detector(LD)
There is analog mode for S1M8836/37. The foLD bits, W3[21:18], are used to select the lock detection mode and
to output the selected lock signal through the foLD pin.
The foLD output becomes HIGH with narrow pulsed LOW while both RF and IF PLLs are locked and thereby the
output should be low-pass filtered for a DC locked voltage HIGH.
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