MDO4000B Datasheet, PDF (20/28 Pages) List of Unclassifed Manufacturers – Mixed Domain Oscilloscopes

Datasheet
Waveform math
Arithmetic
Math functions
FFT
Spectrum math
Advanced math
Add, subtract, multiply, and divide waveforms.
Integrate, Differentiate, FFT.
Spectral magnitude. Set FFT Vertical Scale to Linear RMS or dBV RMS, and FFT Window to Rectangular, Hamming, Hanning, or
Blackman-Harris.
Add or subtract frequency-domain traces.
Define extensive algebraic expressions including waveforms, reference waveforms, math functions (FFT, Intg, Diff, Log, Exp, Sqrt,
Abs, Sine, Cosine, Tangent, Rad, Deg), scalars, up to two user-adjustable variables and results of parametric measurements
(Period, Freq, Delay, Rise, Fall, PosWidth, NegWidth, BurstWidth, Phase, PosDutyCycle, NegDutyCycle, PosOverShoot,
NegOverShoot, PeakPeak, Amplitude, RMS, CycleRMS, High, Low, Max, Min, Mean, CycleMean, Area, CycleArea, and trend
plots), e.g.,(Intg(Ch1 - Mean(Ch1)) × 1.414 × VAR1).
Power measurements (optional)
Power Quality Measurements
V_RMS, V_{Crest Factor}, Frequency, I_RMS, I_{Crest Factor}, True Power, Apparent Power, Reactive Power, Power Factor, Phase Angle.
Switching loss measurements
Power loss
Energy loss
T_on, T_off, Conduction, Total.
T_on, T_off, Conduction, Total.
Harmonics
THD-F, THD-R, RMS measurements. Graphical and table displays of harmonics. Test to IEC61000-3-2 Class A and MIL-
STD-1399, Section 300A.
Ripple measurements
Modulation Analysis
V_Ripple and I_Ripple.
Graphical display of +Pulse Width, –Pulse Width, Period, Frequency, +Duty Cycle, and –Duty Cycle modulation types.
Safe operating area
Graphical display and mask testing of switching device safe operating area measurements.
dV/dt and dI/dt measurements
Cursor measurements of slew rate.
Limit/Mask testing (optional)
Included standard masks ⁴
ITU-T, ANSI T1.102, USB
Test source
Limit test: Any Ch1 - Ch4 or any R1 - R4
Mask test: Any Ch1 - Ch4
Mask creation
Limit test vertical tolerance from 0 to 1 division in 1 m division increments; Limit test horizontal tolerance from 0 to 500 m division in
1 m division increments
Load standard mask from internal memory
Load custom mask from text file with up to 8 segments
Mask scaling
Lock to Source ON (mask automatically re-scales with source-channel settings changes)
Lock to Source OFF (mask does not re-scale with source-channel settings changes)
Test criteria run until
Minimum number of waveforms (from 1 to 1,000,000; Infinity)
Minimum elapsed time (from 1 second to 48 hours; Infinity)
4 _{≥350 MHz bandwidth models are recommended for mask testing on telecomm standards >55 Mb/s. 1 GHz bandwidth models are recommended for mask testing on high-speed (HS) USB.}
20 www.tektronix.com