4507 Datasheet, PDF (109/115 Pages) Renesas Technology Corp – SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER

4507 Group
BUILT-IN PROM VERSION
In addition to the mask ROM versions, the 4507 Group has the
One Time PROM versions whose PROMs can only be written to
and not be erased.
The built-in PROM version has functions similar to those of the
mask ROM versions, but it has PROM mode that enables writing to
built-in PROM.
Table 20 shows the product of built-in PROM version. Figure 54
shows the pin configurations of built-in PROM versions.
The One Time PROM version has pin-compatibility with the mask
ROM version.
Table 20 Product of built-in PROM version
Part number
PROM size
(✕ 10 bits)
M34507E4FP
4096 words
RAM size
(✕ 4 bits)
256 words
Package
ROM type
PRSP0024GA-A One Time PROM [shipped in blank]
(1) PROM mode
The 4507 Group has a PROM mode in addition to a normal opera-
tion mode. It has a function to serially input/output the command
codes, addresses, and data required for operation (e.g., read and
program) on the built-in PROM using only a few pins. This mode
can be selected by setting pins SDA (serial data input/output),
SCLK (serial clock input), PGM to “H” after connecting wires as
shown in Figure 54 and powering on the VDD pin, and then apply-
ing 12 V to the VPP pin.
In the PROM mode, three types of software commands (read, pro-
gram, and program verify) can be used. Clock-synchronous serial
I/O is used, beginning from the LSB (LSB first).
Use the special-perpose serial programmer when performing serial
read/program.
As for the serial programmer for the single-chip microcomputer (se-
rial programmer and control software), refer to the “Renesas
Microcomputer Development Support Tools” Hompage (http://
www.renesas.com/en/tools).
(2) Notes on handling
➀A high-voltage is used for writing. Take care that overvoltage is
not applied. Take care especially at turning on the power.
➁For the One Time PROM version shipped in blank, Renesas
corp. does not perform PROM writing test and screening in the
assembly process and following processes. In order to improve
reliability after writing, performing writing and test according to
the flow shown in Figure 53 before using is recommended (Prod-
ucts shipped in blank: PROM contents is not written in factory
when shipped).
Writing with PROM programmer
Screening (Leave at 150 °C for 40 hours) (Note)
Verify test with PROM programmer
Function test in target device
Note: Since the screening temperature is higher
than storage temperature, never expose the
microcomputer to 150 °C exceeding 100
hours.
Fig. 53 Flow of writing and test of the product shipped in blank
Rev.3.01 2005.02.04 page 109 of 111
REJ03B0107-0301