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HYB25L256160AC Datasheet, PDF (11/18 Pages) Infineon Technologies AG – 256-Mbit Mobile-RAM
HY[B/E]25L256160A[F/C]–7.5
256MBit Mobile-RAM
Electrical Characteristics
4
Electrical Characteristics
4.1
Operating Conditions
Table 6 Absolute Maximum Ratings
Parameter
Symbol
Voltage on I/O pins relative to VSS
Voltage on I/O pins relative to VSS
Voltage on VDD supply relative to VSS
Voltage on VDDQ supply relative to VSS
Operating Case Temperature (extended)
Storage Temperature (Plastic)
Power Dissipation
Short Circuit Output Current
VIN, VOUT
VIN, VOUT
VDD
VDDQ
TCASE
TSTG
PD
IOUT
min.
–1.0
–1.0
–1.0
–1.0
–25
–55
—
—
Values
Unit
typ. max.
—
VDD + 0.5 V
— +4.6
V
— +4.6
V
— +4.6
V
— +85
°C
— +150
°C
— 0.7
W
50 —
mA
Note/
Test Condition
Attention: Stresses above those listed here may cause permanent damage to the device. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
Maximum ratings are absolute ratings; exceeding only one of these values may cause
irreversible damage to the integrated circuit.
Table 7 Recommended Operating Conditions and DC Characteristics1)
Parameter
Symbol
Values
Unit Note/ Test Condition
min.
max.
Supply Voltage
VDD
+2.3
+3.6
V
I/O Supply Voltage
VDDQ
+1.65
+3.6
V
2)
Supply Voltage
VSS
0
0
V
I/O Supply Voltage
VSSQ
0
0
V
Input High (Logic 1) Voltage VIH
0.8 x VDDQ VDDQ + 0.3 V 3)4)
Input Low (Logic 0) Voltage VIL
–0.3
+0.3
V
3)4)
Output High (Logic 1) Voltage VOH
VDDQ – 0.2 —
V IOH = –0.1 mA
Output Low (Logic 0) Voltage VOL
—
+0.2
V IOH = +0.1 mA
Input Leakage Current
IIL
–5
+5
µA Any input 0 V ≤ VIN ≤ VDD;
all other pins not under test VIN = 0 V
Output Leakage Current
IOZ
–5
+5
µA DQ is disabled; 0 V ≤ VOUT ≤ VDDQ
1) 0 °C ≤ TC ≤ 70 °C (comm.) and –25 °C ≤ TCASE ≤ +85 °C
2) VDDQ < VDD + 0.3 V
3) All voltages referenced to VSS
4) VIH may overshoot to VDDQ + 2.0 V for pulse width of < 4 ns.
VIL may undershoot to – 2.0 V for pulse width < 4 ns.
Pulse width measured at 50% points with amplitude measured peak to DC reference
Internet Data Sheet
11
Rev. 1.41, 2006-12
04292004-EQNL-FLNW