TDA5360 Datasheet, PDF (22/34 Pages) NXP Semiconductors – Pre-Amplifier for Hard Disk Drive with MR-Read / Inductive Write Heads

Philips Semiconductors
Pre-Amplifier for Hard Disk Drive with
MR-Read / Inductive Write Heads
Objective Specification, Revision 2.2
TDA5360
- Temperature digitizer
This measurement can be done either in Active Read mode or in Active Write mode.
Note 9a : RSTDMY define DRN pin functionality
RSTDMY
LOW
LOW
HIGH
HIGH
DRN
LOW
HIGH
LOW
HIGH
Function
Serial Interface register reset
No effect
No effect
Dummy Head selected in read mode
Note 9b : MODE1,MODE0 power management control bits
A2 A1 Mode1 Mode0 STWN
CS1 CS0 0
0
x
CS1 CS0 0
1
x
CS1 CS0 1
0
1
11
1
0
0
CS1 CS0 1
1
1
11
1
1
0
11
x
x
1
Sleep
Standby
Active Read or Write
Active STW with one head
Test mode
Active STW with 2 heads in write mode
Forbidden : no change in register
- Test mode is a state where both Reader and Writer are ON when R/W pin is LOW : in write mode, reader
signal is present at RDP-RDN output pins.
- (A2=A1=1 and STWN=0) is a broadcast mode condition, where all the preamps will treat the data arriving on
SDATA line.
- In order to get two write head selected, Head Hx should be programmed in Reg. 00 (x = 0 to 5). In that case
Head Hx and Head H(x+6) will be selected in STW (Servo Track Write) 2 heads.
Note 11a : ENFST define BFAST pin functionality when Thermal Asperity Compression is ON
ENFST
LOW
HIGH
BFAST functionality
inhibit BFAST control of the passband
enable BFAST control of the passband
Note 11b : Thermal Asperity Compression ( TAC ) functionality
When a thermal asperity occurs at the reader input, the reader output signal get superposed with an amplified
signal corresponding, to a certain extent, to the thermal asperity.
1998 July 30
22