TDA5360 Datasheet, PDF (19/34 Pages) NXP Semiconductors – Pre-Amplifier for Hard Disk Drive with MR-Read / Inductive Write Heads

Philips Semiconductors
Pre-Amplifier for Hard Disk Drive with
MR-Read / Inductive Write Heads
Objective Specification, Revision 2.2
TDA5360
8
Measurement Register M4...M0 = 5 bits for Rmr/Temperature digitazation (read back only bits)
RANGE1,RANGE0 = 2bits to define which measurement to be done
(0,0)
RMR measurement for
15Ω < Rmr < 46Ω
Rmr = 698 / (15.5 + M0 + 2*M1 + 4*M2 + 8*M3 + 16*M4)
(0,1) and (1,0) : RMR measurement for
40Ω < Rmr < 90Ω
Rmr = 2094 / ( 21 + M0 + 2*M1 + 4*M2 + 8*M3 + 16*M4 )
(1,1) = Temperature measurement
Temp = 473K - 4.6K * (M0 + 2*M1 + 4*M2 + 8*M3 + 16*M4)
DIGON = is set HIGH to launch a digitazation
( Note 8 )
9
Operating mode
Register
11 Thermal Asperity
Compression
1998 July 30
SIOLVL = level of SDATA when reading back a register
if LOW, 3.3V compatible.
if HIGH, 5.0V compatible.
RSTDMY = define functionality of DRN pin
( Note 9a)
MODE1,MODE0 = 2 power management control bits.
(0,0) Sleep Mode
(0,1) Standby Mode
(1,0) Active Mode or STW one head
(1,1) Test Mode or STW two heads
(Note 9b)
ENFST = when TAC is enable, this bit defines BFAST functionality
( Note 11a)
TAU = Low Pole Frequency time constant of the TAC
LOW = 700 ns
HIGH = 70 ns
TACT2,TACT1,TACT0 = 3 bits to determine the TAC threshold
(0,0,0) =
4.00 mV
(0,0,1) =
2.97 mV
(0,1,0) =
2.21 mV
(0,1,1) =
1.64 mV
(1,0,0) =
1.22 mV
(1,0,1) =
0.91 mV
(1,1,0) =
0.67 mV
(1,1,1) =
0.50 mV
( Note 11b )
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