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TDA8586 Datasheet, PDF (13/24 Pages) NXP Semiconductors – Power amplifier with load detection and auto BTL/SE selection
Philips Semiconductors
Power amplifier with load detection and
auto BTL/SE selection
Preliminary specification
TDA8586
SYMBOL
PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
Quad SE application (see Fig.8)
THD
Po
total harmonic distortion
output power
fi = 1 kHz; Po = 1 W; RL = 4 Ω −
45 Hz < fi < 10 kHz; Po = 1 W; −
RL = 4 Ω; filter: f < 30 kHz
VP = 14.4 V; RL = 4 Ω; note 2
THD = 0.5%
4
0.05 0.15 %
0.5
−
%
4.5
−
W
THD = 10%
5
6
−
W
Gv
voltage gain
Vi(rms) = 15 mV
25
26
27
dB
∆Gv
channel unbalance
Vi(rms) = 15 mV
−0.7
0
+0.7 dB
αcs
channel separation
Po = 2 W; fi = 1 kHz; RL = 4 Ω 40
50
−
dB
VOO
DC output offset voltage
VP = 14.4 V; on condition
−
0
100
mV
VP = 14.4 V; RL = 4 Ω;
mute condition
−
10
20
mV
Vn(o)
noise output voltage on
Rs = 1 kΩ; VP = 14.4 V; note 3 −
80
150
µV
Vn(o)(mute) noise output voltage mute
note 3
−
0
20
µV
Vo(mute)
output voltage mute
Vi(rms) = 1 V
−
3
500
µV
SVRR
supply voltage ripple rejection Rs = 0 Ω; fi = 1 kHz;
Vripple = 2 V (p-p)
on condition
43
47
−
dB
mute condition
55
70
−
dB
Notes
1. Tolerances on the mute level is tight because of the usage of this pin for integration during load detection.
2. The output power is measured directly on the pins of the IC.
3. The noise output is measured in a bandwidth of 20 Hz to 20 kHz.
1999 Apr 08
13