Q32M210 Datasheet, PDF (7/50 Pages) ON Semiconductor – Precision Mixed-Signal 32-bit Microcontroller SPI/SQI interface.

Q32M210
Programmable Gain Amplifier (PGA) allowing signals to be
sampled without external buffering. The ADC data rate is
reconfigurable and a wide range of data rates are possible.
Each ADC conversion takes a fixed time resulting in a
deterministic, periodic sampling. Lower data rates may be
configured to achieve a higher effective dynamic range.
The ADCs operate rail−to−rail from 0 V to VADC (1.8 V)
using the internal VREF Precision Voltage Reference
(0.9 V). Unsigned or two’s complement output samples are
provided to the ARM Cortex−M3 Processor and
synchronized to the periodic ADC interrupt. The DMA may
also be used to transfer samples directly from the ADC to
SRAM.
Each PGA and ADC has 16 multiplexed inputs allowing
a wide range of sensor interface signals to be measured. In
addition, power supply voltages are available as
measurement inputs for application level supply
monitoring.
Programmable Gain Amplifiers
A PGA is used to directly feed each of the ADC inputs.
The PGAs operate in either single−ended mode or
differential mode. Single−ended operation is obtained by
setting one PGA input to VSS. Differential operation is
obtained by routing signals to each of the two PGA inputs.
The resulting voltage is amplified, anti−alias filtered, and
output into the ADC. A wide range of gain steps from 0 dB
to 36 dB allow for optimal adjustment of the PGA output to
match the dynamic range of the ADC.
PGA1 operates in one of three input modes. Each input
mode provides a different common−mode voltage range
with linearity characteristics and tradeoffs. The application
may choose different PGA1 operating modes depending on
the type of measurement being made. PGA0 operates in a
single input mode only.
Automatic Voltage Detection
Automatic voltage detection is available on PGA0. When
enabled, the PGA0 will output an interrupt to the ARM
Cortex−M3 Processor when the PGA0 output voltage
exceeds the configured threshold. To save power the ADCs
may be disabled while waiting for the detection signal.
Auxiliary Inputs
Three auxiliary inputs provide a direct connection to the
PGA and ADC multiplexers. External voltages such as
thermistor networks may be connected to any of these high
impedance inputs for direct measurement with the ADC.
Triple DAC
Three independent 10−bit DACs are available. Each DAC
output is individually controlled by the ARM Cortex−M3
Processor. The DACs provide a high degree of linearity, low
gain and offset temperature drift, and are monotonic within
the normal operating range.
The dynamic range of DAC0 is reconfigurable. The
10−bit output range may be mapped into one of three ranges:
1 x VREF, 2 x VREF, or 3 x VREF. This reconfigurable
dynamic mapping allows a tradeoff between LSB resolution
and dynamic range.
The dynamic range of DAC1 and DAC2 is fixed to 2 x
VREF.
Temperature Sensor
The device contains a built−in temperature sensor. The
temperature sensor works by generating a differential
voltage that varies linearly with temperature. The voltage is
routed into the PGA resulting in a single−ended output
voltage measurable by the ADC.
The temperature sensor is calibrated during factory
production by ON Semiconductor. The calibration value is
stored in the flash. The device junction temperature may be
determined based on the calibration factor and converted
ADC output value.
SPST Switches
The device contains four analog general−purpose,
low−leakage, low−Ron, single−pole single−throw switches
(SPSTs). Each SPST consists of 2 ports – A and B. The SPST
connection is determined by the application and may be
changed in real−time. Port A can be connected or
disconnected from Port B.
The SPSTs can be used for routing both power supplies
and signals. Each SPST is designed to conduct a continuous
current of up to ± 10 mA. This provides sufficient current
bandwidth to supply power to external devices such as LCD
displays or wireless transceivers.
When routing signals through the SPST, the low−leakage
characteristics allow the switch to create a high isolation
between a measurement node and the sensor interface. The
application may connect the measurement node to the sensor
interface through the SPST as required. The low−leakage
characteristics allow the SPST to be added to the signal
chain without interfering with the impedance properties of
the measurement node.
Multi−Switches
The device contains four analog general−purpose,
low−leakage, low−Ron multi−switches (MSWs). Each
MSW consists of 3 ports – Port A, Port B, and Port C
(Common). The MSW connection is determined by the
application and may be changed in real−time. The MSW
may be configured to connect A to C, B to C, A and B to C,
or neither to C. A signal of interest may be connected to the
common port, and selectively routed to A, B, or A and B.
Alternately, two signals of interest may be connected to A
and B, respectively, and either one selectively routed to C.
The MSWs may be used for routing both power supplies
and signals. Each MSW is designed to conduct a continuous
current of up to 10 mA. This provides sufficient current
bandwidth to supply power to external devices such as LCD
displays or wireless transceivers.
The MSWs may be configured to switch based on the
on−chip reconfigurable pulse−width modulator (PWM).
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