Q32M210 Datasheet, PDF (18/50 Pages) ON Semiconductor – Precision Mixed-Signal 32-bit Microcontroller SPI/SQI interface.

Q32M210
Pin Connections
The following table describes the required and recommended external connections and components. These connections and
components are required to ensure proper device operation and performance.
Table 3. REQUIRED AND RECOMMENDED EXTERNAL CONNECTIONS AND COMPONENTS
Pin
External Connection or Component
Recommended Value
VDDD
Power supply filtering capacitor
C = 22 mF
VCPLDO
Power supply filtering capacitor
C = 22 mF
AAF0
Anti−aliasing filtering capacitor
C = 1 mF (for 160−320 Hz cut−off range)
AAF1
Anti−aliasing filtering capacitor
C = 1 mF (for 160−320 Hz cut−off range)
VDBL
Power supply filtering capacitor
C = 10 mF
VBATA
Battery supply filtering capacitor
C = 22 mF
VBAT
Battery supply filtering capacitor
C = 22 mF
CP0, CP1
Charge pump capacitor between CP0, CP1
C = 1 mF
VDDIO0
I/O supply filtering capacitor
C = 22 mF
VDDIO1
I/O supply filtering capacitor
C = 22 mF
VDDUSB
Battery supply filtering capacitor
C = 10 mF
RTCXTAL0, RTCXTAL1 Crystal for real−time clock (No capacitors required)
f = 32768 Hz, C = 9 pF, ESR = 70 kW
USBXTAL0, USBXTAL1 Crystal for USB (No capacitors required)
f = 48.0 MHz, C = 10 pF, ESR = 70 W
VREF
Power supply filtering capacitor
C = 22 mF
IREF
Current reference resistor
R = 300 kW (± 1%, |TC| < 100 ppm/C)
VADC
Power supply filtering capacitor
C = 22 mF
VLCD
Power supply filtering capacitor
C = 1 mF
VLCD1
LCD driver voltage filtering capacitor
C = 1 nF
VLCD0
LCD driver voltage filtering capacitor
C = 1 nF
NMI
Test point recommended
TEST
Test pin must be connected to VSS
Thermal
Thermal must be connected to battery VSS
USBDP, USBDN
ESD protection for USB bus
P/N = ON Semiconductor NUP2201MR6T1G
Table 4. ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Min
Max
Units
Input voltage on any digital pin
−0.3
3.6
V
Input voltage on any analog pin
−0.3
3.6
V
Input voltage on any supply pin
−0.3
3.6
V
Current on any digital pin
±5
mA
Current on any analog pin
± 10
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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