AMIS-30523 Datasheet, PDF (4/35 Pages) ON Semiconductor – CAN Micro-Stepping Motor Driver

AMIS−30523
Table 1. PIN DESCRIPTION
Name
Pin
Description
MOTYN
31, 32 Positive end of phase Y coil output
/
33
No function (to be left open in normal operation)
MOTXN
34, 35 Positive end of phase X coil output
GND
36, 37 Ground, heat sink
MOTXP
38, 39 Negative end of phase X coil output
VBB
40, 41 High voltage supply input
PORB/WD
42
Power−on−reset and watchdog reset output (open drain)
TST0
43
Test pin input (to be tied to ground in normal operation)
/
44
No function (to be left open in normal operation)
DO
45
SPI data output (open drain)
VDD
46
5V Logic Supply Output (needs external decoupling
capacitor)
GND
47
Ground
CANH
48
High−level CAN bus line (high in dominant mode)
CANL
49
Low−level CAN bus line (low in dominant mode)
/
50
No function (to be left open in normal operation)
STB
51
CAN stand−by mode control input
TXD
52
CAN transmit data input; low input ³ dominant driver;
internal pull−up current
Type
Driver Output
Equivalent Schematic
Driver Output
Supply
Driver Output
Supply
Digital Output
Digital Input
Type 3
Type 2
Digital Output
Supply
Supply
Analog Output
Analog Output
Type 4
Type 6
Digital Input
Digital Input
Table 2. ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Min
Max
Unit
V_BB
Analog DC supply voltage (Note 1)
−0.3
+40
V
V_CC
CAN Supply voltage
−0.3
+7
V
V_CANH,
V_CANL,
V_SPLIT
DC voltage CANH ,CANL and VSPLIT (Note 2)
−50
+50
V
V_TRANS Transient voltage CANH, CANL and VSPLIT (Note 3)
−300 +300
V
T_ST
Storage temperature
−55 +150
°C
T_J
Junction Temperature under bias (Note 4)
−40 +170
°C
V_ESD
Electrostatic discharges on component level, All pins (Note 5)
−2
+2
kV
V_ESD
Electrostatic discharges on component level, All pins (Note 7)
−500 +500
V
V_ESD
Electrostatic discharges on CANH, CANL and VSPLIT (Note 6)
−6
+6
kV
V_ESD
Electrostatic discharges on CANH and CANL (Note 7)
−500 +500
V
V_ESD
Electrostatic discharges on component level, HiV pins (Note 6)
−6
+6
kV
Latch−up Static latch−up at all pins
100
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. For limited time < 0.5 s.
2. For 0 < V_CC < 5.25 V unlimited time
3. Applied transient waveforms in accordance with ISO 7637 part 3, test pulses 1, 2, 3a, and 3b.
4. Circuit functionality not guaranteed.
5. Standardized Human body model (100 pF via 1.5 kW, according to JEDEC EIA−JESD22−A114−B).
6. Standardized human body model electrostatic discharge (ESD) pulses (100 pF via 1.5 kW) stressed pin to ground.
7. Standardized charged device model ESD pulses when tested according to ESD STM5.3.1−1999.
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