N34C04 Datasheet, PDF (2/11 Pages) ON Semiconductor – 4-Kb Serial SPD EEPROM for DDR4 DIMM

N34C04
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameter
Rating
Units
Operating Temperature
−45 to +130
°C
Storage Temperature
−65 to +150
°C
Voltage on any pin (except A₀) with respect to Ground (Note 1)
−0.5 to +6.5
V
Voltage on pin A₀ with respect to Ground
−0.5 to +10.5
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than V_CC + 0.5 V. The A₀ pin can be raised to a HV level for SWP
command execution. SCL and SDA inputs can be raised to the maximum limit, irrespective of V_CC.
Table 2. RELIABILITY CHARACTERISTICS
Symbol
Parameter
N_END (Note 2)
Endurance
T_DR
Data Retention
2. Page Mode, V_CC = 2.5 V, 25°C
Min
1,000,000
100
Units
Write Cycles
Years
Table 3. THERMAL CHARACTERISTICS (Note 3)
Parameter
Test Conditions/Comments
Max
Unit
Thermal Resistance q_JA
Junction−to−Ambient (Still Air)
92
°C/W
3. Power Dissipation is defined as P_J = (T_J − T_A)/q_JA, where T_J is the junction temperature and T_A is the ambient temperature. The thermal
resistance value refers to the case of a package being used on a standard 2−layer PCB.
Table 4. D.C. OPERATING CHARACTERISTICS (Vcc = 1.7 V to 3.6 V, TA = −40°C to +125°C, unless otherwise specified)
Symbol
Parameter
Test Conditions
Min
Max
Units
I_CCR
I_CCW
I_SB
Read Current
Write Current
Standby Current
Read, f_SCL = 400 kHz or 1 MHz
Write, during t_WR (Note 4)
All I/O Pins at
GND or Vcc
Vcc < 2.2 V
Vcc ≥ 2.2 V
1
mA
1
mA
1
mA
2
I_L
I/O Pin Leakage
Pin at GND or V_CC
2
mA
V_IL
Input Low Voltage
−0.5
0.3*Vcc
V
V_IH
Input High Voltage
0.7*Vcc V_CC + 0.5
V
V_OL1
Output Low Voltage
V_CC ≥ 2.2 V, I_OL = 20 mA
0.4
V
V_OL2
Output Low Voltage
V_CC < 2.2 V, I_OL = 6.0 mA
0.2
V
V_POR+
Power On Reset Threshold
(Note 4)
1.3
V
V_POR−
Power Off Reset Threshold
(Note 4)
0.8
V
4. Tested initially and after a design or process change that affects this parameter
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
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