XOCLCC6EVB Datasheet, PDF (1/9 Pages) ON Semiconductor – Crystal Clock Oscillator Module Evaluation Board Manual for NBX Family

XOCLCC6EVB
Crystal Clock Oscillator
Module Evaluation Board
Manual for NBX Family in 6
Pin CLCC 5mm X 7mm
Package
Generic Evaluation Board: XOCLCC6EVB
Devices: NBXxxxx
Prepared by: Senad Lomigora, Casey Stys
and Paul Shockman
http://onsemi.com
Description
This Evaluation Board manual (XOCLCC6EVB/D) is a
guide for using the XOCLCC6EVB Evaluation Board to
provide a convenient platform for quickly evaluating,
characterizing and verify performance and operation of a
device in the NBXxxxx family of Clock Oscillator Modules
packaged in the 6 pin CLCC, 5mm by 7 mm, CASE 848AB
(see Appendix).
This family of devices offer an internal crystal and PLL
IC. This Evaluation Board Manual and Evaluation Board
should be used in conjunction with a specific device data
sheet, which contains full technical details on specifications
and operation.
An NBXxxxx Clock Oscillator Module device may be
directly solder mounted onto the available evaluation board
footprint; or multiple units may be inserted and tested by
solder mounting a separate insertion socket (P/N
AM0393−320R from SER Electronics) onto the available
footprint.
Evaluation Board Features
• 6 pin CLCC solder footprint for solder mounting a
device or test socket
• Incorporates jumper headers to conveniently and
manually control the levels for the ’Output Enable’
(Pin 1) and ’Frequency Select’ (Pin 2) pins.
• Enable single or split−power supply operation.
LVPECL differential outputs are accessed via SMA
connectors offering different output load configurations.
Evaluation Board Manual Document Features
• Information on the XOCLCC6EVB Evaluation Board
• Appropriate Lab Setup and Procedures
• Board build Bill of Materials (Table 5)
• Evaluation Board schematic (Figure 7)
• Evaluation Board Lamination Stackup (Figure 8)
• Evaluation Board Fabrication Notes
• Appendix:
− MECHANICAL CASE OUTLINE
− GENERIC MARKING DIAGRAM
− SOLDERING FOOTPRINT
What measurements can you expect to make?
With this evaluation board, the following measurements
could be performed in single−ended or differential modes of
operation.
• DC Characteristics
• Frequency Performance
• Output Rise and Fall Time
• Phase Noise
• Jitter
Front
Back
Figure 1. Evaluation Board Images (Front and Back)
© Semiconductor Components Industries, LLC, 2008
1
September, 2008 − Rev. 1
Publication Order Number:
XOCLCC6EVB/D