NSAM265SR Datasheet, PDF (21/58 Pages) National Semiconductor (TI) – CompactSPEECH Digital Speech Processors

3 0 Command Set (Continued)
Command Type
Mnemonic S A
Description
SDET
SE
SETD
SF
SMT
SO
SPS
SS
SV
SW
TUNE
VC
WRAM
S
Set Detectors Mask
S
Skip to End of Message
S
Set Time and Day
S
Skip Forward
S
Set Message Tag
A
Say One Word
S
Set Playback Speed
A
Say Sentence
S
Set Vocabulary Type
A
Say Words
S
Tune Index
S
Volume Control
S
Write RAM
Opcode
Hex
10
24
0F
22
05
07
16
1F
20
21
15
28
17
Command Parameters
Description
Length
Bytes
Detectors Mask
1
None
Time Day
2
Length of Time
2
Message Tag
2
Word Number
1
Speed Value
1
Sentence n
1
Mode Id
1a1
N Word₁ Word_n
Index Value
1an
1a2
Increment Decrement
1
Message Tag Data
2 a 32
Return Value
Description ^Length
Bytes
None
None
None
None
None
None
None
None
None
None
None
None
None
3 2 COMMANDS DESCRIPTION
The commands are listed in alphabetical order
Each command indicates by a the chips for which it is
intended Commands which are not intended for a particular
chip are valid for that chip but have no effect Chip-specific
features of a command which is intended for both chips are
indicated by the chip name in the margin
The execution time for all commands when specified in-
cludes the time required for the microcontroller to retrieve
the return value where appropriate
The execution time does not include the protocol timing
overhead i e the execution times are measured from the
moment that the command is detected as valid until the
command is fully executed
AMAP
Check and Map ARAM action number
NSAM265SR
NSAM265SFV
This command runs diagnostics on the ARAMs and returns
a 1-byte result The following actions are performed accord-
ing to the 1-byte action number parameter
Action 0
Checks the ARAM configuration The return value is encod-
ed as follows
Bits 0 – 1 Number of ARAM devices (1 or 2)
Bits 2 – 3 Number of ARAM columns in multiples of 1k
units (1 or 2)
Bits 4 – 6 Number of ARAM rows in multiples of 1k units (1
2 or 4)
Action 1
This action is intended to be carried out on the production
line It performs the following tests
Address line test
Scan one row from start to end and from end to start
Write to line X and check that line Y is not written (RAS
CAS not connected test)
Walking 1 and walking 0 on the data lines
Action 1 then performs Action 3 (see below) on the first 60
rows only This allows you to record a short memo of up to
5-seconds duration to check the system and codec Execu-
tion time is less than 1 second
This action returns 0 if the ARAMs pass the connectivity
test or the ID of the first ARAM to fail The return value is
1-byte long IDs are allocated according to the following
scheme
TL EE 12378 – 15
Action 2
Performs a one-pass test clears the entire ARAM to 0 and
marks all the bad rows in the internal row table If more than
0 5% nibbles in a row are bad the row is mapped as bad If
more than 200 of the rows are bad the EV ERROR bit in
the status word and the ERR ARAM bit in the error word
are set to 1
This operation does not detect ARAM cross-talk problems
Action 2 of the AMAP command should be invoked immedi-
ately after the INIT command and is valid only in the IDLE
state If this command is not issued the ARAM is consid-
ered as a DRAM (no errors)
The test takes up to 20 seconds
Action 3
Performs a two-pass test to map and return the number of
bad rows If more than 0 5% nibbles in a row are bad the
row is mapped as bad If more than 5% of the rows are bad
the EV ERROR bit in the status word and the ERR
ARAM bit in the error word are set to 1 This diagnostic also
detects ARAM cross-talk problems
21