HPC16064 Datasheet, PDF (2/36 Pages) National Semiconductor (TI) – High-Performance microController

Absolute Maximum Ratings
If Military Aerospace specified devices are required
please contact the National Semiconductor Sales
Office Distributors for availability and specifications
Total Allowable Source or Sink Current
100 mA
Storage Temperature Range
b65 C to a150 C
Lead Temperature (Soldering 10 sec )
300 C
V_CC with Respect to GND
b0 5V to 7 0V
All Other Pins
(V_CC a 0 5)V to (GND b 0 5)V
Note Absolute maximum ratings indicate limits beyond
which damage to the device may occur DC and AC electri-
cal specifications are not ensured when operating the de-
vice at absolute maximum ratings
DC Electrical Characteristics
V_CC 5V g10% T_A 0 C to a70 C for HPC46064 46004 b40 C to a85 C for HPC36064 36004 b40 C to a105 C for
HPC26064 26004 b55 C to a125 C for HPC16064 16004
Symbol
Parameter
Test Conditions
Min
Max Units
I_CC1
Supply Current
V_CC 5 5V f_in 30 MHz (Note 1)
V_CC 5 5V f_in 20 MHz (Note 1)
V_CC 5 5V f_in 2 0 MHz (Note 1)
I_CC2
IDLE Mode Current
V_CC 5 5V f_in 30 MHz (Note 1)
V_CC 5 5V f_in 20 MHz (Note 1)
V_CC 5 5V f_in 2 0 MHz (Note 1)
I_CC3
HALT Mode Current
V_CC 5 5V f_in 0 kHz (Note 1)
V_CC 2 5V f_in 0 kHz (Note 1)
INPUT VOLTAGE LEVELS FOR SCHMITT TRIGGERED INPUTS RESET NMI AND WO AND ALSO CKI
65
mA
47
mA
10
mA
5
mA
3 0 mA
1
mA
300 mA
100 mA
V_IH1
Logic High
V_IL1
Logic Low
ALL OTHER INPUTS
0 9 V_CC
V
0 1 V_CC V
V_IH2
Logic High
V_IL2
Logic Low
I_LI1
Input Leakage Current
I_LI2
Input Leakage Current RDY HLD EXUI
I_LI3
Input Leakage Current B12
C_I
Input Capacitance
C_IO
I O Capacitance
OUTPUT VOLTAGE LEVELS
V_IN 0 and V_IN
V_IN 0
RESET 0 V_IN
(Note 2)
(Note 2)
V_CC
V_CC
0 7 V_CC
V
0 2 V_CC V
g2
mA
b3
b50 mA
05
7
mA
10
pF
20
pF
V_OH1 Logic High (CMOS)
I_OH b10 mA (Note 2)
V_OL1 Logic Low (CMOS)
I_OH 10 mA (Note 2)
V_OH2
V_OL2
Port A B Drive CK2
(A₀ – A₁₅ B₁₀ B₁₁ B₁₂ B₁₅)
I_OH b7 mA
I_OL 3 mA
V_OH3
V_OL3
Other Port Pin Drive WO (open
drain) (B₀ – B₉ B₁₃ B₁₄ P₀ – P₃)
I_OH b1 6 mA (except WO)
I_OL 0 5 mA
V_OH4 ST1 and ST2 Drive
I_OH b6 mA
V_OL4
I_OL 1 6 mA
V_OH5
V_OL5
Port A B Drive (A₀ – A₁₅ B₁₀ B₁₁ B₁₂ B₁₅) When
Used as External Address Data Bus
I_OH b1 mA
I_OL 3 mA
V_RAM RAM Keep-Alive Voltage
(Note 3)
I_OZ
TRI-STATE Leakage Current
V_IN 0 and V_IN V_CC
Note 1 I_CC1 I_CC2 I_CC3 measured with no external drive (I_OH and I_OL 0 I_IH and I_IL
V_CC CKI driven to V_IH1 and V_IL1 with rise and fall times less than 10 ns
Note 2 This is guaranteed by design and not tested
Note 3 Test duration is 100 ms
0) I_CC1 is measured with RESET
V_CC b 0 1
V
01
V
24
V
04
V
24
V
04
V
24
V
04
V
24
V
04
V
25
V_CC
V
g5
mA
V_SS I_CC3 is measured with NMI
2