MLX80004 Datasheet, PDF (35/38 Pages) Melexis Microelectronic Systems – Enhanced Universal Dual/Quad LIN Transceiver

MLX80002/MLX80004
Enhanced Universal Dual/Quad LIN Transceiver
Datasheet
14.5. Test circuitry for automotive transients
Figure 13: Test circuit for automotive transients
Figure 13 shows the general requirement on the test circuitry for applying automotive transient test pulses.
In order to represent the most critical network impedance, the LINx pins has to be connected via 1kOhm / decoupling
diode to the Schaffner test generator. Including the integrated master termination of 1kOhm, the minimum network
resistance of 500Ohm can be simulated by adding an external 1Kohm resistor.
In slave application mode (DIS_MAS = Vs), the external coupling has to be applied via 500Ohm resistor.
Revision 021 – Sept 2016
Page 35 of 38