MLX80004 Datasheet, PDF (33/38 Pages) Melexis Microelectronic Systems – Enhanced Universal Dual/Quad LIN Transceiver

MLX80002/MLX80004
Enhanced Universal Dual/Quad LIN Transceiver
Datasheet
14. ESD and EMC
In order to minimize EMC influences, the PCB has to be designed according to EMC guidelines.
The products MLX80004/2 are ESD sensitive devices and have to be handled according to the rules in IEC61340-5-2.
The products MLX80004/2 are evaluated according AEC-Q100-002 (HBM) and AEC-Q100-011 (CDM).
The extended ESD/EMC tests (acc. to IEC 61000-4-2, LIN Conf. Test Specification Package for LIN2.1, OEM hardware
requirements for LIN, CAN and FlexRay Interfaces in automotive applications – Audi, BMW, Daimler, Porsche,
Volkswagen - Rev. 1.3/2012) have been tested by external certificated test houses.
The test reports are available on request.
14.1. Automotive Qualification Test Pulses
Automotive test pulses are applied on the module in the application environment and not on the naked IC. Therefore
attention must be taken, that only protected pins (protection by means of the IC itself or by means of external
components) are wired to a module connector. In the recommended application diagrams, the reverse polarity diode
together with the capacitors on supply pins, the protection resistors in several lines and the load dump protected IC
itself will protect the module against the below listed automotive test pulses. The exact value of the capacitors for the
application has to be figured out during design-in of the product according to the automotive requirements.
For the LIN pin the specification “LIN Physical Layer Spec 2.1 (Nov. 24, 2006)” is valid.
Supply Pin VS is protected via the reverse polarity diode and the supply capacitors. No damage will occur for defined
test pulses. A deviation of characteristics is allowed during pulse 1 and 2; but the module will recover to the normal
function after the pulse without any additional action. During test pulse 3a, 3b, 5 the module will work within
characteristic limits.
14.2. Test Pulses On supply Lines
Parameter
Symbol
Min
Max
Dim Coupling
test condition,
functional status
Transient test pulses in accordance to ISO7637-2 (supply lines) & , VS=13.5V, TA=(23 ± 5)°C
& (Document: “Hardware Requirements for LIN, CAN and FlexRay Interfaces in Automotive Applications”; Audi, BMW, Daimler,
Porsche, VW; 2009-12-02)
Test pulse #1
vpulse1
-100
V
Direct
5000 pulses,
functional state C
Test pulse #2
vpulse2
75
V
Direct
5000 pulses,
functional state A
Test pulse #3a
vpulse3a
-150
V
Direct
1h,functional state A
Test pulse #3b
vpulse3b
100
V
Direct
1h,functional state A
Load dump test pulse in accordance to ISO7637-2 (supply lines), VS=13.0V, TA=(23 ±5)°C
65
87
Test pulse #5b
vpulse5b
(+13V
(+13V
V
(VS))
(VS))
Direct
1 pulse clamped to 27V (+13V
(VS)),
(32V (+13V (VS))for
applications for north America),
functional state C
Table 14: Test pulses Supply Line
Revision 021 – Sept 2016
Page 33 of 38