ISL33001 Datasheet, PDF (8/19 Pages) Intersil Corporation – I2C Bus Buffer with Rise Time Accelerators and Hot Swap Capability

ISL33001, ISL33002, ISL33003
Test Circuits and Waveforms (Continued)
+3.3V
2.7kΩ
SCL_OUT
2.7kΩ
SCL_IN
2.7kΩ
V_{CC1 SDA_OUT}
SDA_IN
V_IN
100pF
GND
100pF
100pF
100pF
2.7kΩ
V_IN
SCL_IN OR
SDA_IN
SCL_OUT OR
SDA_OUT
*t_PLH
*t_PHL
*Propagation delay measured between 50% of V_CC1
FIGURE 5A. TEST CIRCUIT
FIGURE 5B. MEASUREMENT POINTS
FIGURE 5. PROPAGATION DELAY
I_ACC = CΔV/Δt
2.7kΩ
V_CC1
2.7kΩ 2.7kΩ
100kΩ
SCL_OUT
SCL_IN
2nF
V_{CC1 SDA_OUT}
GND
SDA_IN
FIGURE 6. ACCELERATOR CURRENT TEST CIRCUIT
*_VX
V_CC1
*_VX
10kΩ
10kΩ
SCL_OUT
V_CC1
10kΩ
SDA_OUT
10kΩ
SCL_IN
SDA_IN
GND
*_{VX < VCC1}
(See Figure 20)
FIGURE 7. ACCELERATOR PULSE WIDTH TEST CIRCUIT
8
FN7560.2
September 30, 2010