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ISL6261A Datasheet, PDF (5/34 Pages) Intersil Corporation – Single-Phase Core Regulator for IMVP-6 Mobile CPUs
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ISL6261A
Electrical Specifications VDD = 5V, TA = -40°C to +100°C, unless otherwise specified. (Continued) Boldface limits apply over the
operating temperature range, -40°C to +100°C. (Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
(Note 7)
MAX
TYP
(Note 7) UNITS
Leakage
POWER GOOD and PROTECTION MONITOR
VR = 16V
-
-
1
μA
PGOOD Low Voltage
PGOOD Leakage Current
PGOOD Delay
VOL
IOH
tpgd
IPGOOD = 4mA
PGOOD = 3.3V
CLK_EN# low to PGOOD high
-
0.11
0.4
V
-1
-
1
µA
5.5
6.8
8.1
ms
Overvoltage Threshold
Severe Overvoltage Threshold
OCSET Reference Current
OC Threshold Offset
OVH
OVHS
VO rising above setpoint > 1ms
VO rising above setpoint > 0.5µs
I(RBIAS) = 10µA
DROOP rising above OCSET > 120µs
155
1.675
9.8
-3.5
195
235 mV
1.7
1.725 V
10
10.2 µA
-
3.5
mV
Undervoltage Threshold
(VDIFF-SOFT)
UVf
VO below set point for > 1ms
-360
-300
-240 mV
LOGIC THRESHOLDS
VR_ON and DPRSLPVR Input Low
VR_ON and DPRSLPVR Input High
Leakage Current on VR_ON
Leakage Current on DPRSLPVR
DAC(VID0-VID6), PSI# and
DPRSTP# Input Low
VIL(3.3V)
VIH(3.3V)
IIL
IIH
IIL_DPRSLP
IIH_DPRSLP
VIL(1.0V)
Logic input is low
Logic input is high
DPRSLPVR logic input is low
DPRSLPVR logic input is high
-
-
1
V
2.3
-
-
V
-1
0
-
μA
-
0
1
μA
-1
0
-
μA
-
0.45
1
μA
-
-
0.3
V
DAC(VID0-VID6), PSI# and
DPRSTP# Input High
VIH(1.0V)
0.7
-
-
V
Leakage Current of DAC(VID0-VID6)
IIL
DPRSLPVR logic input is low
and DPRSTP#
IIH
DPRSLPVR logic input is high
THERMAL MONITOR
-1
0
-
μA
-
0.45
1
μA
NTC Source Current
NTC = 1.3 V
53
60
67
µA
Over-temperature Threshold
V(NTC) falling
1.17
1.2
1.25
V
VR_TT# Low Output Resistance
CLK_EN# OUTPUT LEVELS
RTT
I = 20mA
-
5
9
Ω
CLK_EN# High Output Voltage
VOH
3V3 = 3.3V, I = -4mA
2.9
3.1
-
V
CLK_EN# Low Output Voltage
VOL
ICLK_EN# = 4mA
-
0.18
0.4
V
NOTES:
6. Limits established by characterization and are not production tested.
7. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.
5
FN6354.3
November 5, 2009
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