X28HC64_06 Datasheet, PDF (12/17 Pages) Intersil Corporation – 5 Volt, Byte Alterable EEPROM

X28HC64
ABSOLUTE MAXIMUM RATINGS
Temperature under bias
X28HC64 ......................................... -10°C to +85°C
X28HC64I, X28HC64M .................. -65°C to +135°C
Storage temperature.......................... -65°C to +150°C
Voltage on any pin with
respect to V_SS ......................................... -1V to +7V
D.C. output current ............................................... 5mA
Lead temperature
(soldering, 10 seconds).................................. 300°C
COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device (at these or any other conditions above those indi-
cated in the operational sections of this specification) is
not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Temperature
Commercial
Industrial
Military
Min.
0°C
-40°C
-55°C
Max.
+70°C
+85°C
+125°C
Supply Voltage
X28HC64
Limits
5V ±10%
D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.)
Symbol
I_CC
I_SB1
I_SB2
I_LI
I_LO
V_lL(2)
V_IH(2)
V_OL
V_OH
Parameter
V_CC current (active)
(TTL inputs)
V_CC current (standby)
(TTL inputs)
V_CC current (standby)
(CMOS inputs)
Input leakage current
Output leakage current
Input LOW voltage
Input HIGH voltage
Output LOW voltage
Output HIGH voltage
Min.
-1
2
2.4
Limits
Typ.⁽¹⁾
15
Max.
40
Unit
mA
1
2
mA
100
200 µA
±10 µA
±10 µA
0.8
V
V_CC + 1 V
0.4
V
V
Test Conditions
CE = OE = V_IL, WE = V_IH, All I/O’s = open,
address inputs = TTL levels @ f = 10 MHz
CE = V_IH, OE = V_IL All I/O’s = open,
other inputs = V_IH
CE = V_CC - 0.3V, OE = GND, All I/O’s = open,
other inputs = V_CC - 0.3V
V_IN = V_SS to V_CC
V_OUT = V_SS to V_CC, CE = V_IH
I_OL = 5mA
I_OH = -5mA
Notes: (1) Typical values are for T_A = 25°C and nominal supply voltage
(2) V_IL min. and V_IH max. are for reference only and are not tested.
12
FN8109.1
June 7, 2006