X28C512_06 Datasheet, PDF (11/21 Pages) Intersil Corporation – 5V, Byte Alterable EEPROM

X28C512, X28C513
Absolute Maximum Ratings
Temperature under bias
X28C512, X28C513 . . . . . . . . . . . . . . . . . . . . . . . .-10°C to +85°C
X28C512I/513I . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +135°C
X28C512M/513M . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +135°C
Storage temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Voltage on any pin with respect to V_SS . . . . . . . . . . . . . . -1V to +7V
D.C. output current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5mA
Lead temperature (soldering, 10s). . . . . . . . . . . . . . . . . . . . . . 300°C
Recommended Operating Conditions
Temperature Range
Commercial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Industrial. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-40°C to +85°C
Military . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-55°C to +125°C
Supply Voltage Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5V ±10%
CAUTION: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional
operation of the device (at these or any other conditions above those listed in the operational sections of this specification) is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
DC Electrical Specifications Over recommended operating conditions, unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
I_CC
V_CC current (active) (TTL inputs)
CE = OE = V_IL, WE = V_IH, All I/O’s = open, address
inputs = 0.4V/2.4V Levels @ f = 5MHz
I_SB1 V_CC current (standby) (TTL inputs)
CE = V_IH, OE = VIL, All I/O’s = open, other inputs = V_IH
I_SB2
V_CC current (standby) (CMOS inputs)
CE = V_CC - 0.3V, OE = VIL, All I/O’s = Open, Other Inputs
= V_IH
I_LI
Input leakage current
V_IN = V_SS to V_CC
I_LO
Output leakage current
V_OUT = V_SS to V_CC, CE = V_IH
V_lL
Input LOW voltage
-1
(Note 1)
V_IH
Input HIGH voltage
2
(Note 1)
V_OL Output LOW voltage
I_OL = 2.1mA
V_OH Output HIGH voltage
I_OH = -400µA
2.4
NOTE:
1. V_IL min. and V_IH max. are for reference only and are not tested.
MAX
50
UNIT
mA
3
mA
500
µA
10
µA
10
µA
0.8
V
V_CC + 1
V
0.4
V
V
Power-Up Timing
SYMBOL
PARAMETER
t_PUR (Note 2)
t_PUW (Note 2)
Power-up to read operation
Power-up to write operation
MAX
100
5
UNIT
µs
ms
Capacitance T_A = +25°C, f = 1MHz, V_CC = 5V
SYMBOL
PARAMETER
C_I/O (Note 2)
C_IN (Note 2)
Input/output capacitance
Input capacitance
TEST CONDITIONS
V_I/O = 0V
V_IN = 0V
MAX
10
10
UNIT
pF
pF
Endurance and Data Retention
PARAMETER
Endurance
Endurance
Data retention
MIN
10,000
100,000
100
MAX
UNIT
Cycles per byte
Cycles per page
Years
NOTE:
2. This parameter is periodically sampled and not 100% tested.
11
FN8106.2
June 7, 2006