TLE5011_11 Datasheet, PDF (37/45 Pages) Infineon Technologies AG – GMR Angle Sensor

TLE5011
Specification
3.10
Test Structures
Two different test signal structures are implemented in the TLE5011:
• Functional Angle Test. In this case, well-known signals feed the ADCs.
• Temperature Measurement. This is useful to read out the chip temperature for compensation purposes.
3.10.1 Functional Angle Tests
It is possible to feed the ADCs with appropriate values to simulate a certain magnet position and other GMR
effects.
The values are generated with resistors on the chip.
The following X / Y ADC values can be programmed:
• 4 points, circle amplitude = 70.7%
(0°, 90°, 180°, 270°)
• 8 points, circle amplitude = 100.0%
(0°, 45°, 90°, 135°,180°, 225°, 270°, 315°)
• 8 points, circle amplitude = 122.1%
(35.3°, 54.7°, 125.3°, 144.7°, 215.3°, 234.7°, 305.3°, 324.7°)
• 4 points, circle amplitude = 141.4%
(45°, 135°, 225°, 315°)
Note: The 100% values typically correspond to 21700 digits and a voltage of ~ 110 mV.
Table 18 Functional Angle Test
Register bits
X / Y Values (decimal)
min.
typ.
000
-400
0
001
14800
15500
010
20700
21700
011
100 ¹⁾
-400
0
101
-16200
-15500
110
-22700
-21700
111
1) Not allowed to use.
32767
-32768
max.
400
16200
22700
400
-14800
-20700
Final Data Sheet
37
V2.0, 2011-03