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SGW50N60HS_09 Datasheet, PDF (3/11 Pages) Infineon Technologies AG – High Speed IGBT in NPT-technology 30% lower Eoff compared to previous generation
SGW50N60HS
Switching Characteristic, Inductive Load, at Tj=25 °C
Parameter
Symbol
Conditions
IGBT Characteristic
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Turn-on energy
Turn-off energy
Total switching energy
-
td(on)
tr
td(off)
tf
Eon
Eoff
Ets
Tj=25°C,
VCC=400V,IC=50A,
VGE=0/15V,
RG=6.8Ω
L σ 1) = 5 5 n H ,
Cσ1) =40pF
Energy losses include
“tail” and diode
reverse recovery2).
Switching Characteristic, Inductive Load, at Tj=150 °C
Parameter
Symbol
Conditions
IGBT Characteristic
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Turn-on energy
Turn-off energy
Total switching energy
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Turn-on energy
Turn-off energy
Total switching energy
td(on)
tr
td(off)
tf
Eon
Eoff
Ets
td(on)
tr
td(off)
tf
Eon
Eoff
Ets
Tj=150°C
VCC=400V,IC=50A,
VGE=0/15V,
RG= 1.8Ω
Lσ1) =60nH,
Cσ1) =40pF
Energy losses include
“tail” and diode
reverse recovery2).
Tj=150°C
VCC=400V,IC=50A,
VGE=0/15V,
RG= 6.8Ω
Lσ1) =60nH,
Cσ1) =40pF
Energy losses include
“tail” and diode
reverse recovery2).
min.
-
-
-
-
-
-
-
min.
-
-
-
-
-
-
-
-
-
-
-
-
-
-
Value
typ.
47
32
310
16
1.08
0.88
1.96
Value
typ.
50
28
225
14
1
0.90
1.9
48
31
350
20
1.5
1.1
2.6
Unit
max.
- ns
-
-
-
- mJ
-
-
Unit
max.
- ns
-
-
-
- mJ
-
-
- ns
-
-
-
- mJ
-
-
1 Leakage inductance Lσ an d Stray capacity Cσ due to test circuit in Figure E.
2 Diode used in this test is IDP45E60
Power Semiconductors
3
Rev. 2.3 Nov 09