TLE8209-2SA Datasheet, PDF (10/38 Pages) Infineon Technologies AG – SPI Programmable H-Bridge

TLE8209-2SA
Power Supply
CONFIG0=’0’: ABE is inactive after VDD returned to normal operating voltage and filtering time has expired.
At the transition from overvoltage to normal condition, the output stages will return to normal operation. For output
control via SPI the bits MUX and SINx in the config register have to be re-programmed. New failures are not stored
to diagnostic registers during overvoltage, register content remains valid, writing new information to configure
registers is possible as far as they are not reset by ABE.
VDD Monitoring Test Mode
Testing of VDD monitoring is possible in SPI mode only. The latch function for over voltage at VDD has to be
switched of (CONFIG0=0 in STATCON_REG)
Testing upper threshold:
By writing 00xxxxxxb into STATCON_REG, the overvoltage threshold is reduced to VDD_TEST_H.
STATCON_REG bit 2 and 0 have to be LOW then. After writing 1xxxxxxxb to STATCON_REG, bit 2 and 0 in
STATCON_REG must be HIGH again
Testing lower threshold:
By writing 01xxxxxxb into STATCON_REG, the undervoltage threshold is increased to VDD_TEST_L.
STATCON_REG bit 2 and 1 have to be LOW then. After writing 1xxxxxxxb to STATCON_REG, bit 2 and 1 in
STATCON_REG must be HIGH again.
5.3
VDDIO - Digital Output Supply and Diagnostic Mode Selection
The voltage at V_DDIO is used to supply the output buffer at the SO pin (serial output of SPI-interface). The VDDIO
pin is also used to select SPI- or in status flag (SF) diagnostic mode. As soon as V_DDIO is lower than V_{DDIO_L}, the
device is put into status flag mode.
.
to internal logic
(SF-mode / SPI-mode)
+
-
SF/SPI - mode
threshold V_{DDIO_L}
VDDIO
SO
from internal logic
Figure 4 V_DDIO and SO-Pin
Data Sheet
10
Rev. 1.0, 2010-02-16