954226 Datasheet, PDF (19/22 Pages) Integrated Device Technology – Programmable Timing Control HubTM for Mobile P4TM Systems

954226
Programmable Timing Control Hub^TM for Mobile P4^TM Systems
Test Clarification Table
Comments
· FS_C/TEST_SEL is a 3-level latched input.
o Power-up w/ V >= 2.0V to select TEST
o Power-up w/ V < 2.0V to have pin function as
FS_C.
· When pin is FS_C, VIH_FS and VIL_FS levels
apply.
· FS_B/TEST_MODE is a low-threshold input
o VIH_FS and VIL_FS levels apply.
o TEST_MODE is a real time input
· TEST_SEL can be invoked after power up
through SMBus B1b7.
o If TEST is selected by B1b7, only B2b3 controls
TEST_MODE. The FS_B/TEST_Mode pin is not
used.
· Power must be cycled to exit TEST.
HW
FSLC/TES
T_SEL
HW PIN
0
1
1
1
FSLB/TES
T_MODE
HW PIN
X
0
0
1
SW
TEST
ENTRY REF/N or
BIT
HI-Z
W1b7 W2b3 OUTPUT
0
X NORMAL
X
0
HI-Z
X
1
REF/N
X
0
REF/N
1
1
X
1
REF/N
0
X
1
0
HI-Z
0
X
1
1
REF/N
W1b7: 1= ENTER TEST MODE, Default = 0 (NORMAL OPERATION)
W2b3: 1= REF/N, Default = 0 (HI-Z)
IDT^® Programmable Timing Control Hub^TM for Mobile P4^TM Systems
19
0930A—04/13/10