8413S12I-100 Datasheet, PDF (10/33 Pages) Integrated Device Technology – Ten 100MHz clocks for PCI Express

8413S12I-100 DATA SHEET
Table 7D. AC Characteristics, V_DD = 3.3V ± 5%, V_{DDO_[A:E]} = V_{DDO_F} = V_{DDO_G} = V_{DDO_QREF} = 3.3V ± 5%; or
V_DD = 3.3V ± 5%, V_{DDO_G} = V_{DDO_QREF} = 2.5V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum
V_RB
Ring-Back Voltage Margin;
NOTE 1, 2
-100
100
t_STABLE
Time before V_RB is allowed;
NOTE 1, 2
500
V_MAX
Absolute Max Output Voltage;
NOTE 3, 4
1150
V_MIN
V_CROSS
Absolute Min Output Voltage;
NOTE 3, 5
Absolute Crossing Voltage;
NOTE 3, 6, 7
Q[A:E],
nQ[A:E]
-300
250
550
V_CROSS
Total Variation of V_CROSS over
All Edges; NOTE 3, 6, 8
140
t_SLEW+
t_SLEW-
odc
Rising Edge Rate; NOTE 1, 9
Falling Edge Rate; NOTE 1, 9
Output Duty Cycle
0.6
5.5
0.6
5.5
48
52
tjit(Ø)
RMS Phase Jitter, (Random) QREF[0:1]
156.25MHz,
Integration Range:
(10kHz to 5MHz)
0.60
0.96
QF
20% to 80%
400
1400
t_R /t_F
Output Rise/Fall Time
QG
20% to 80%
400
QREF[0:1]
20% to 80%
300
1400
1400
QF
measured at V_{DDO_F}/2
48
52
odc
Output Duty Cycle
QG
measured at V_{DDO_G}/2
45
55
QREF[0:1] measured at V_{DDO_QREF}/2
45
55
Units
mV
ps
mV
mV
mV
mV
V/ns
V/ns
%
ps
ps
ps
ps
%
%
%
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
All parameters measured at f_OUT unless noted otherwise.
NOTE 1: Measurement taken from differential waveform.
NOTE 2: t_STABLE is the time the differential clock must maintain a minimum ±150mV differential voltage after rising/falling edges before it is
allowed to drop back into the Vrb ±100mV range. See Parameter Measurement Information Section.
NOTE 3: Measurement taken from single-ended waveform.
NOTE 4: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 5: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
NOTE 6: Measured at the crossing point where the instantaneous voltage value of the rising edge of Q[Ax:Ex] equals the falling edge of
nQ[Ax:Ex].
NOTE 7: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing
points for this measurement.
NOTE 8: Defined as the total variation of all crossing voltages of rising Q[Ax:Ex] and falling nQ[Ax:Ex]. This is the maximum allowed variance
in Vcross for any particular system.
NOTE 9: Measured from -150mV to +150mV on the differential waveform (derived from Q[Ax:Ex] minus nQ[Ax:Ex]). The signal must be
monotonic through the measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero
crossing.
CLOCK GENERATOR FOR CAVIUM PROCESSORS
10
REVISION B 2/03/2015