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HN29V51211 Datasheet, PDF (21/42 Pages) Hitachi Semiconductor – 512M AND type Flash Memory More than 32,113-sector (542,581,248-bit)
HN29V51211 Series
Parameter
Symbol Min Typ Max Unit Test conditions
Notes
SC setup for WE
CE hold time for OE
t SW
50
—
—
ns
t COH
0
—
—
ns
SA (2) to CA (2) delay time tSCD
RDY/Busy setup for SC
t RS
—
—
30
µs
200 —
—
ns
Time to device busy
t DB
—
—
150 ns
Busy time on reset mode
t RBSY
—
45
—
µs
Notes: 1. tDF is a time after which the I/O pins become open.
2. tWSD (min) is specified as a reference point only for SC, if tWSD is greater than the specified tWSD (min)
limit, then access time is controlled exclusively by tSAC.
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