MC9S08AC60 Datasheet, PDF (327/348 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics and Timing Specifications
A.13 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.13.1 Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
the table.
Parameter
Table A-16. Conducted Transient Susceptibility
Symbol
Conditions
f_OSC/f_BUS
Result
Amplitude¹
(Min)
Unit
32.768kHz
A
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V_{CS_EFT}
V_DD = 5.0V
T_A = +25^oC
package type
64 QFP
crystal
2MHz Bus
B
C
± 2.8²
± 2.8
kV
± 2.8
D
± 3.8
1 _{Data based on qualification test results. Not tested in production.}
2 _{The RESET pin is susceptible to the minimum applied transient of 220V. However, adding the recommended 0.1μF decoupling}
capacitor should prevent failures below the minimum amplitude.
The susceptibility performance classification is described in Table A-17.
Table A-17. Susceptibility Performance Classification
Result
A
B
Performance Criteria
No failure
The MCU performs as designed during and after exposure.
Self-recovering The MCU does not perform as designed during exposure. The MCU returns
failure
automatically to normal operation after exposure is removed.
C
Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
MC9S08AC60 Series Data Sheet, Rev. 2
Freescale Semiconductor
327