K11P80M50SF4 Datasheet, PDF (22/54 Pages) Freescale Semiconductor, Inc – K11 Sub-Family Data Sheet

Peripheral operating requirements and behaviors
Symbol
J1
J2
J3
J4
J5
J6
J7
J8
J9
J10
J11
J12
J13
J14
Table 13. JTAG full voltage range electricals
Description
Operating voltage
TCLK frequency of operation
• Boundary Scan
• JTAG and CJTAG
• Serial Wire Debug
Min.
1.71
0
0
0
TCLK cycle period
1/J1
TCLK clock pulse width
• Boundary Scan
50
• JTAG and CJTAG
25
• Serial Wire Debug
12.5
TCLK rise and fall times
—
Boundary scan input data setup time to TCLK rise
20
Boundary scan input data hold time after TCLK rise
0
TCLK low to boundary scan output data valid
—
TCLK low to boundary scan output high-Z
—
TMS, TDI input data setup time to TCLK rise
8
TMS, TDI input data hold time after TCLK rise
1.4
TCLK low to TDO data valid
—
TCLK low to TDO high-Z
—
TRST assert time
100
TRST setup time (negation) to TCLK high
8
Max.
3.6
10
20
40
—
—
—
—
3
—
—
25
25
—
—
22.1
22.1
—
—
TCLK (input)
J2
J3
J3
J4
J4
Figure 4. Test clock input timing
Unit
V
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
K11 Sub-Family Data Sheet Data Sheet, Rev. 3, 08/2012.
22
Freescale Semiconductor, Inc.