MC9S08QD4 Datasheet, PDF (186/202 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
A.7 Internal Clock Source Characteristics
Table A-7. Internal Clock Source Specifications
Characteristic
Symbol
Min
Typ¹
Max Unit
Average internal reference frequency - untrimmed
Average internal reference frequency - trimmed
DCO output frequency range - untrimmed
DCO output frequency range - trimmed
Resolution of trimmed DCO output frequency at fixed voltage and
temperature (Consumer and Industrial MC9S08QDx)²
f_{int_ut}
f_{int_t}
f_{dco_ut}
f_{dco_t}
25
31.25 41.66 kHz
—
31.25
—
kHz
12.8
16
21.33 MHz
—
16
—
MHz
—
—
± 0.2
Resolution of trimmed DCO output frequency at fixed voltage and
Δf_{dco_res_t}
temperature (Automotive S9S08QDx)²
—
–40°C to 0°C
0 to 125°C
%f_dco
—
± 0.3
± 0.2
Total deviation of trimmed DCO output frequency over voltage and
temperature ²
Consumer and Industrial MC9S08QDx
Δf_{dco_t}
—
—
±2
%f_dco
Automotive S9S08QDx
±3
FLL acquisition time ^2,3
t_acquire
1
ms
Long term Jitter of DCO output clock (averaged over 2 ms interval) ⁴
C_Jitter
—
—
0.6
%f_dco
1 _{Data in Typical column was characterized at 3.0 V and 3.0 V, 25°C or is typical recommended value.}
2 _{Characterized, but not tested.}
3 _{This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or changing}
from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the reference,
this specification assumes it is already running.
4 _{Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fBUS.}
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V_DD and V_SS and variation in crystal oscillator frequency increase the C_Jitter percentage for
a given interval.
MC9S08QD4 Series MCU Data Sheet, Rev. 3
186
Freescale Semiconductor