RHFAC14K01V Datasheet, PDF (14/24 Pages) List of Unclassifed Manufacturers – STANDARD MICROCIRCUIT DRAWING

4.4.1 Group A inspection
a. Tests shall be as specified in table II herein.
b. For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table in figure 2 herein. The test
vectors used to verify the truth table shall, at a minimum, test all functions of each input and output. All possible input
to output logic patterns per function shall be guaranteed, if not tested, to the truth table in figure 2, herein. For device
classes Q and V, subgroups 7 and 8 shall include verifying the functionality of the device.
c. C_IN and C_PD shall be measured only for initial qualification and after process or design changes which may affect
capacitance. C_IN shall be measured between the designated terminal and GND at a frequency of 1 MHz. C_PD shall be
tested in accordance with the latest revision of JEDEC Standard No. 20 and table I herein. For C_IN and C_PD, test all
applicable pins on five devices with zero failures.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1005 of MIL-STD-883.
b. T_A = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electrical parameters shall be as specified in table II herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All
device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T_A = +25°C ±5°C, after exposure, to the subgroups specified in table II herein.
c. RHA tests for device classes M, Q, and V for levels M, D, P, L, R, and F shall be performed through each level to
determine at what levels the devices meet the RHA requirements. These RHA tests shall be performed for initial
qualification and after design or process changes which may affect the RHA performance of the device.
d. Prior to irradiation, each selected sample shall be assembled in its qualified package. It shall pass the specified
group A electrical parameters in table I for subgroups specified in table II herein.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
B
5962-87624
SHEET
14