EN29LV040A_11 Datasheet, PDF (19/33 Pages) Eon Silicon Solution Inc. – 4 Megabit (512K x 8-bit ) Uniform Sector, CMOS 3.0 Volt-only Flash Memory

Test Conditions
Device Under Test
C_L
EN29LV040A
Test Specifications
Test Conditions
Output Load Capacitance, C_L
Input Rise and Fall times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
-45R
-55R
-70
Unit
30
30
30
pF
5
5
5
ns
0.0-3.0 0.0-3.0 0.0-3.0
V
1.5
1.5
1.5
V
1.5
1.5
1.5
V
This Data Sheet may be revised by subsequent versions
19
or modifications due to changes in technical specifications.
© 2003 Eon Silicon Solution, Inc.,
Rev. E, Issue Date: 2011/10/27
www.eonssi.com